TOP
0
0
【13悅讀日】4/13~4/17 消費滿699送100元E-coupon

縮小範圍


商品類型


原文書 (3)

商品狀況


可訂購商品 (3)

庫存狀況


無庫存 (3)

商品定價


$800以上 (3)

出版日期


2016年以前 (3)

裝訂方式


平裝 (1)

作者


Edited by David E. Laughlin 、Kenneth P. Rodbell 、Olivier Thomas 、Bing Zhang (1)
Edited by Kenneth P. Rodbell 、William F. Filter 、Harold J. Frost 、Paul S. Ho (1)
Edited by Peter Børgesen 、John C. Coburn 、William F. Filter 、John E. Sanchez、Jr. 、Kenneth P. Rodbell (1)

出版社/品牌


CAMBRIDGE UNIVERSITY PRESS (2)
Cambridge University Press (1)

三民網路書店 / 搜尋結果

3筆商品,1/1頁
Materials Reliability in Microelectronics III:VOLUME309
滿額折

1.Materials Reliability in Microelectronics III:VOLUME309

作者:Edited by Kenneth P. Rodbell ; William F. Filter ; Harold J. Frost ; Paul S. Ho  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1993/08/31 裝訂:平裝
The proceedings of the title symposium, held in San Francisco in April 1993, comprise invited and contributed papers in the areas of dielectric reliability; microstructure effects on reliability; stre
定價:1665 元, 優惠價:9 1499
無庫存,下單後進貨(到貨天數約30-45天)
Polycrystalline Metal and Magnetic Thin Films:VOLUME562
90折

2.Polycrystalline Metal and Magnetic Thin Films:VOLUME562

作者:Edited by David E. Laughlin ; Kenneth P. Rodbell ; Olivier Thomas ; Bing Zhang  出版社:Cambridge University Press  出版日:1999/11/22 裝訂:平裝
Proceedings of an April 1999 symposium, organized in sections on magnetic thin films, thin film microstructure texture and stress, copper microstructure, nanocrystalline magnetic thin films, and thin
定價:1845 元, 優惠價:9 1661
無庫存,下單後進貨(到貨天數約30-45天)
Materials Reliability in Microelectronics IV:VOLUME338
滿額折

3.Materials Reliability in Microelectronics IV:VOLUME338

Proceedings from the Materials Research Society symposium held in San Francisco, April 1994. Invited and contributed papers cover oxides, thin films, experimental techniques, stress in semiconductors
定價:1665 元, 優惠價:9 1499
無庫存,下單後進貨(到貨天數約30-45天)

暢銷榜

客服中心

收藏

會員專區