Novel ‘very deep sub-micron’ technologies in digital circuit manufacture have raised the profile of process variability as an issue. This volume focuses on storage elements and examines the consequenc
Describing practical modeling and characterization techniques for designing reliable electrical circuits, this volume includes a thorough presentation of robust designs for major VLSI units. Its first
This book describes the integration, characterization and analysis of cost-efficient thin-film transistors (TFTs), applying zinc oxide as active semiconductors. The authors discuss soluble gate diele
