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Measuring Attachment: Developmental Assessment Across the Lifespan

Measuring Attachment: Developmental Assessment Across the Lifespan

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This volume provides an in-depth examination of traditional and emerging measures of attachment behavior and representations from infancy to adulthood. Leading authorities share their expertise on the Strange Situation, the Attachment Q-set, Ainsworth's Maternal Sensitivity Scales, the Adult Attachment Interview, the Attachment Script Assessments, and the Adult Attachment Projective Picture System, as well as analogue and experimental methods. The book clarifies the conceptual and empirical underpinnings of the various measures and shows how they fit into a coherent developmental framework. Offering detailed discussions of key constructs such as attachment security, the secure base phenomenon, disorganization, and narrative structure, this is a valuable resource for both researchers and practitioners who use attachment assessments in their work.

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定價:100 3105
無庫存,下單後進貨
(到貨天數約30-45天)

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