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【簡體曬書區】 單本79折,5本7折,活動好評延長至5/31,趕緊把握這一波!

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2016年以前 (2)

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Joseph Goldstein (EDT)/ Dale E. Newbury (EDT)/ David B. Williams (EDT) (1)
Joseph I. Goldstein (EDT)/ Dale E. Newbury/ Patrick Kchlin/ David C. Joy/ Charles E. Lyman/ Eric Lifshin/ Linda Sawyer/ Joseph R. Michael (1)

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Springer Verlag (1)

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X-Ray Spectrometry in Electron Beam Instruments

1.X-Ray Spectrometry in Electron Beam Instruments

作者:Joseph Goldstein (EDT); Dale E. Newbury (EDT); David B. Williams (EDT)  出版社:Springer Verlag  出版日:2012/10/21 裝訂:平裝
From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, an
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Scanning Electron Microscopy and X-Ray Microanalysis

2.Scanning Electron Microscopy and X-Ray Microanalysis

Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imag
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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