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Edited by Osamu Ueda 、Mitsuo Fukuda 、Stephen J. Pearton 、Edwin L. Piner 、Paolo Montangero (1)
Laurent Bechou/ Mitsuo Fukuda/ Giovanna Mura/ Massimo Vanzi (EDT) (1)
Osamu Ueda (EDT)/ Mitsuo Fukuda (EDT)/ Kenji Shiojima (EDT)/ Edward Piner (EDT) (1)

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CAMBRIDGE UNIVERSITY PRESS (2)
Elsevier Science Ltd (1)

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3筆商品,1/1頁

1.Reliability and Materials Issues of Iii-v and Ii-vi Semiconductor Optical and Electron Devices and Materials II

作者:Osamu Ueda (EDT); Mitsuo Fukuda (EDT); Kenji Shiojima (EDT); Edward Piner (EDT)  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:2012/08/27 裝訂:精裝

Symposium G was held April 9-13 at the 2012 MRS Spring Meeting.

定價:4050元   優惠價: 93645

無庫存,下單後進貨(採購期約45個工作天)

2.Reliability and Materials Issues of Semiconductor Optical and Electrical Devices and Materials:VOLUME1195

作者:Edited by Osamu Ueda ;Mitsuo Fukuda ;Stephen J. Pearton ;Edwin L. Piner ;Paolo Montangero  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:2010/08/20

定價:5310元   優惠價: 94779

無庫存,下單後進貨(採購期約45個工作天)

3.Advanced Laser Diode Reliability

作者:Laurent Bechou; Mitsuo Fukuda; Giovanna Mura; Massimo Vanzi (EDT)  出版社:Elsevier Science Ltd  出版日:2020/12/01 裝訂:精裝

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical

定價:4950元   優惠價: 94455