TOP
0
0
即日起~6/30,暑期閱讀書展,好書7折起

縮小範圍


商品類型

原文書 (3)
商品狀況

可訂購商品 (3)
庫存狀況

無庫存 (3)
商品定價

$800以上 (3)
出版日期

2016年以前 (3)
作者

Edited by Cynthia A. Volkert 、Ad H. Verbruggen 、Dirk D. Brown (1)
Edited by Michael J. Fluss 、Robert J. Kee 、David Srolovitz 、Cynthia A. Volkert (1)
Edited by Shefford P. Baker 、Peter Børgesen 、Caroline A. Ross 、Paul H. Townsend 、Cynthia A. Volkert (1)
出版社/品牌

CAMBRIDGE UNIVERSITY PRESS (3)

三民網路書店 / 搜尋結果

3筆商品,1/1頁
Thin Films:Stresses and Mechanical Properties V:VOLUME356
滿額折
Papers presented at the title symposium, held at the 1994 Fall Meeting of the MRS. The topics of the six invited papers: stress and its effect on intermixing in Si 1 - xGe x/Si superlattices; aspects
定價:1665 元, 優惠價:9 1499
無庫存,下單後進貨(到貨天數約30-45天)
Modeling and Simulation of Thin-Film Processing:VOLUME389
滿額折
作者:Edited by Michael J. Fluss ; Robert J. Kee ; David Srolovitz ; Cynthia A. Volkert  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1995/10/02 裝訂:平裝
The April 1995 symposium brought together the materials science community interested in modeling thin-film growth and processing. It included researchers performing computer simulations on length scal
定價:1665 元, 優惠價:9 1499
無庫存,下單後進貨(到貨天數約30-45天)
Materials Reliability in Microelectronics IX:VOLUME563
滿額折
作者:Edited by Cynthia A. Volkert ; Ad H. Verbruggen ; Dirk D. Brown  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1999/10/01 裝訂:平裝
These proceedings contain 47 of the 79 papers presented at the April 1999 symposium. The main subjects are solder and barrier layer reliability, electromigration modeling, electromigration in interco
定價:1665 元, 優惠價:9 1499
無庫存,下單後進貨(到貨天數約30-45天)

暢銷榜

客服中心

收藏

會員專區