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Laung-Terng Wang, Yao-Wen Chang and Kwang-Ting (Tim) Cheng (1)
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Laung-terng Wang (EDT)/ Cheng-Wen Wu (EDT)/ Xiaoqing Wen (EDT) (1)
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VLSI Test Principles And Architectures ─ Design for Testability
作者:Laung-terng Wang (EDT); Cheng-Wen Wu (EDT); Xiaoqing Wen (EDT)  出版社:Morgan Kaufmann Pub  出版日:2006/07/07 裝訂:精裝
This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, princip
絕版無法訂購
System-On-Chip Test Architectures
作者:Laung-terng Wang (EDT); Charles E. Stroud (EDT); Nur A. Touba  出版社:Elsevier Science Ltd  出版日:2007/11/20 裝訂:精裝
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor indu
定價:3823 元, 優惠價:1 3823
無庫存,下單後進貨(到貨天數約30-45天)
Electronic Design Automation
作者:Laung-Terng Wang; Yao-Wen Chang and Kwang-Ting (Tim) Cheng  出版社:ACADEMIC PRESS  出版日:2009/01/01 裝訂:平裝
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to t
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