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【簡體曬書節】 單本79折,5本7折,優惠只到5/31,點擊此處看更多!

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原文書 (3)
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可訂購商品 (3)
庫存狀況

無庫存 (3)
商品定價

$400~$599 (1)
$800以上 (2)
出版日期

2016年以前 (3)
裝訂方式

平裝 (2)
精裝 (1)
作者

Nigel D. Browning (2)
Nigel Browning (1)
出版社/品牌

Cambridge Univ Pr (2)
Aurum Press UK (1)

三民網路書店 / 搜尋結果

3筆商品,1/1頁
Household Management for Men
滿額折
作者:Nigel Browning  出版社:Aurum Press UK  出版日:2012/03/01 裝訂:平裝
Domestic God or Sofa Slob? This unique work now available in a revised and expanded edition, contains everything the modern man needs to discover the art of household management.
定價:549 元, 優惠價:79 434
無庫存,下單後進貨(到貨天數約45-60天)
Characterization of High Tc Materials and Devices by Electron Microscopy
90折
作者:Nigel D. Browning  出版社:Cambridge Univ Pr  出版日:2006/11/23 裝訂:平裝
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier
定價:2144 元, 優惠價:9 1930
無庫存,下單後進貨(到貨天數約45-60天)
Characterization of High Tc Materials and Devices by Electron Microscopy
作者:Nigel D. Browning  出版社:Cambridge Univ Pr  出版日:2000/07/06 裝訂:精裝
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier
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