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即日起~6/30,暑期閱讀書展,好書7折起

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原文書 (2)
商品狀況

可訂購商品 (2)
庫存狀況

無庫存 (2)
商品定價

$800以上 (2)
出版日期

2016年以前 (2)
裝訂方式

平裝 (1)
精裝 (1)
作者

Peter Aaen (2)
出版社/品牌

Cambridge Univ Pr (2)

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2筆商品,1/1頁
Modeling and Characterization of RF and Microwave Power FETs
作者:Peter Aaen  出版社:Cambridge Univ Pr  出版日:2007/06/28 裝訂:精裝
This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Modeling and Characterization of RF and Microwave Power FETs
作者:Peter Aaen  出版社:Cambridge Univ Pr  出版日:2011/06/30 裝訂:平裝
This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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