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2018~2019 (7)
2016~2017 (3)
2016年以前 (20)
裝訂方式

平裝 (4)
精裝 (26)
作者

Olaf Stenzel (2)
Winfried Monch (2)
Andrea Cusano (EDT)/ Marco Consales (EDT)/ Alessio Crescitelli (EDT)/ Armando Ricciardi (EDT) (1)
Chunli Bai (1)
D. J. O'Connor (EDT)/ B. A. Sexton (EDT)/ R. St. C. Smart (EDT) (1)
Denis Gerasimov/ Eugeny I. Yurin (1)
Eiichi Hirota/ H. Sakakima/ K. Inomata (1)
Farzad Nasirpouri (1)
Gianangelo Bracco (EDT)/ Bodil Holst (EDT) (1)
Giorgio Benedek/ Jan Peter Toennies (1)
Jacques Jupille (EDT)/ Geoff Thornton (EDT) (1)
Jan Toporski (EDT)/ Thomas Dieing (EDT)/ Olaf Hollricher (EDT) (1)
Karsten Hinrichs (EDT)/ Klaus-jochen Eichhorn (EDT) (1)
M. A. Van Hove (EDT)/ S. Y. Tong (EDT) (1)
Michael Grunze (EDT)/ Hans J. Kreuzer (EDT) (1)
Michael Haschke (1)
Michail Michailov (EDT) (1)
Mihai Stafe/ Aurelian Marcu/ Niculae Puscas (1)
Nong Moon Hwang (1)
Olaf Stenzel (EDT)/ Miloslav Ohl獮al (EDT) (1)
出版社/品牌

Springer Verlag (27)
Springer Nature (3)

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30筆商品,1/2頁
Surface Analysis Methods in Materials Science
作者:D. J. O'Connor (EDT); B. A. Sexton (EDT); R. St. C. Smart (EDT)  出版社:Springer Verlag  出版日:2003/06/01 裝訂:精裝
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of su
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02-25006600[分機130、131]。
Electronic Properties of Semiconductor Interfaces
作者:Winfried Monch  出版社:Springer Verlag  出版日:2004/03/05 裝訂:精裝
Using the continuum of interface-induced gap states (IFIGS) as a unifying theme, Monch explains the band-structure lineup at all types of semiconductor interfaces. These intrinsic IFIGS are the wave-f
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02-25006600[分機130、131]。
Semiconductor Surfaces and Interfaces
作者:Winfried Monch  出版社:Springer Verlag  出版日:2001/05/01 裝訂:精裝
This long-awaited third edition deals with structural and electronic properties of semiconductor surfaces and interfaces. The first part introduces the general aspects of space-charge layers, of clean
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02-25006600[分機130、131]。
Adhesion and Friction ― Proceedings of the Third International Workshop on Interface Phenomena, Dalhousie University, Halifax, N.s., Canada, August 23 - 27,1988
作者:Michael Grunze (EDT); Hans J. Kreuzer (EDT)  出版社:Springer Verlag  出版日:2011/12/13 裝訂:平裝
This volume contains the proceedings of the 3rd LASST-ACSIS workshop on "Adhesion and Friction" held at Dalhousie University, Halifax, Canada, in August 1988. Basic physical and chemical concepts for
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Non-classical Crystallization of Thin Films and Nanostructures in Cvd and Pvd Processes
作者:Nong Moon Hwang  出版社:Springer Verlag  出版日:2016/06/23 裝訂:精裝
The content of this book would be based on Prof. Hwang’s one-semester lectures on “Special Topics on Semiconductor Materials” for graduate students. The lectures are based on the new understanding of
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02-25006600[分機130、131]。
Surface Science Techniques
作者:Gianangelo Bracco (EDT); Bodil Holst (EDT)  出版社:Springer Verlag  出版日:2012/12/31 裝訂:精裝
The book describes experimental techniques used to study surfaces and interfaces, offering descriptions of real experimental setups to illustrate the strength and the limits of the techniques. Reviews
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02-25006600[分機130、131]。
Pulsed Laser Ablation of Solids ─ Basics, Theory and Applications
作者:Mihai Stafe; Aurelian Marcu; Niculae Puscas  出版社:Springer Verlag  出版日:2013/11/21 裝訂:精裝
This comprehensive work on pulsed laser ablation explicitly links the principles and methodology to the physical properties of the irradiated materials. From the basics to the most advanced topics, it
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02-25006600[分機130、131]。
Atomic Scale Dynamics at Surfaces ― Theory and Experimental Studies With Helium Atom Scattering
作者:Giorgio Benedek; Jan Peter Toennies  出版社:Springer Nature  出版日:2019/01/14 裝訂:精裝
Experimental advances in helium atom scattering spectroscopy over the last forty years have allowed the measurement of surface phonon dispersion curves of more than 200 different crystal surfaces and
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02-25006600[分機130、131]。
The Physics of Thin Film Optical Spectra ― An Introduction
作者:Olaf Stenzel  出版社:Springer Verlag  出版日:2015/10/02 裝訂:精裝
The book bridges the gap between fundamental physics courses (such as optics, electrodynamics, quantum mechanics and solid state physics) and highly specialized literature on the spectroscopy, design,
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02-25006600[分機130、131]。
Ion Beam Modification of Solids ― Ion-solid Interaction and Radiation Damage
作者:Werner Wesch (EDT); Elke Wendler (EDT)  出版社:Springer Verlag  出版日:2016/07/26 裝訂:精裝
This book presents the method of ion beam modification of solids in realization, theory and applications in a comprehensive way. It provides a review of the physical basics of ion-solid interaction an
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02-25006600[分機130、131]。
Ellipsometry of Functional Organic Surfaces and Films
作者:Karsten Hinrichs (EDT); Klaus-jochen Eichhorn (EDT)  出版社:Springer Verlag  出版日:2018/05/23 裝訂:精裝
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use
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02-25006600[分機130、131]。
Electrodeposition of Nanostructured Materials
作者:Farzad Nasirpouri  出版社:Springer Verlag  出版日:2016/10/24 裝訂:精裝
This book provides an overview of electrodeposition of nanomaterials from principles to modern concepts for advanced materials in science and technology. Electrochemical deposition or electrodepositio
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02-25006600[分機130、131]。
Optical Characterization of Thin Solid Films
作者:Olaf Stenzel (EDT); Miloslav Ohl獮al (EDT)  出版社:Springer Verlag  出版日:2018/03/19 裝訂:精裝
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are brief
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02-25006600[分機130、131]。
Confocal Raman Microscopy
作者:Jan Toporski (EDT); Thomas Dieing (EDT); Olaf Hollricher (EDT)  出版社:Springer Verlag  出版日:2018/03/16 裝訂:精裝
This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded
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02-25006600[分機130、131]。
Kinetics of Evaporation
作者:Denis Gerasimov; Eugeny I. Yurin  出版社:Springer Nature  出版日:2018/09/17 裝訂:精裝
This monograph discusses the essential principles of the evaporationprocess by looking at it at the molecular and atomic level.In the first part methods of statistical physics, physical kinetics andnu
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02-25006600[分機130、131]。
Kelvin Probe Force Microscopy ― From Single Charge Detection to Device Characterization
作者:Sascha Sadewasser (EDT); Thilo Glatzel (EDT)  出版社:Springer Verlag  出版日:2018/03/19 裝訂:精裝
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and nume
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02-25006600[分機130、131]。
Islands, Mounds, and Atoms ― Patterns and Processes in Crystal Growth Far from Equilibrium
作者:T. Michely; T. Michely (EDT); J. Krug  出版社:Springer Verlag  出版日:2004/02/01 裝訂:精裝
Crystal growth far from thermodynamic equilibrium is nothing but homoepitaxy - thin film growth on a crystalline substrate of the same material. Because of the absence of misfit effects, homoepitaxy i
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02-25006600[分機130、131]。
Scanning Tunneling Microscopy and Its Application
作者:Chunli Bai  出版社:Springer Verlag  出版日:2000/10/01 裝訂:平裝
This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and me
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02-25006600[分機130、131]。
Nanophenomena at Surfaces ─ Fundamentals of Exotic Condensed Matter Phenomena
作者:Michail Michailov (EDT)  出版社:Springer Verlag  出版日:2011/02/18 裝訂:精裝
This book presents the state of the art in nanoscale surface physics. It outlines contemporary trends in the field covering a wide range of topical areas: atomic structure of surfaces and interfaces,
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02-25006600[分機130、131]。
Coherent Light Microscopy
作者:Pietro Ferraro (EDT); Adam Wax (EDT); Zeev Zalevsky (EDT)  出版社:Springer Verlag  出版日:2011/02/09 裝訂:精裝
This book deals with the latest achievements in the field of optical coherent microscopy. While many other books exist on microscopy and imaging, this book provides a unique resource dedicated solely
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