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Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France),Hytch, Martin (Laboratoire d'Optique Electronique du Centre National de la Recher (1)
Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France),Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National (1)
Hawkes, Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France),Hytch, Martin (Laboratoire d'Optique Electronique du Centre National de (1)
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James Thompson (EDT)/ Peter B. Hammond (EDT)/ Robert W. Hawkes (EDT)/ Buford H. Junker (EDT) (1)
Mikhail Yavor (EDT)/ Peter W. Hawkes (EDT) (1)
Peter W. (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES) Hawkes Toulouse France),Erwin (Institute of Applied Physics Kasper University of Tuebingen Tuebing (1)
Peter W. Hawkes (EDT)/ John C. H. Spence (EDT) (1)
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
作者:Mikhail Yavor (EDT); Peter W. Hawkes (EDT)  出版社:Academic Pr  出版日:2009/07/24 裝訂:精裝
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended a
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02-25006600[分機130、131]。
Advances in Imaging and Electron Physics
作者:Peter W. Hawkes (EDT); Martin Hytch (EDT)  出版社:Academic Pr  出版日:2019/02/20 裝訂:精裝
Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features
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02-25006600[分機130、131]。
Science of Microscopy
作者:Peter W. Hawkes (EDT); John C. H. Spence (EDT)  出版社:Springer Verlag  出版日:2006/11/21 裝訂:精裝
The examination of structure at the microscopic scale, between micrometers and angstrom units, has changed dramatically in recent decades. Many new types of microscopy have emerged, notably the many s
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02-25006600[分機130、131]。
Advances in Imaging and Electron Physics: Dirac's Difference Equation and the Physics of Finite Differences
作者:Henning F. Harmuth; Beate Meffert; Peter W. Hawkes (EDT)  出版社:Academic Pr  出版日:2008/11/07 裝訂:精裝
In this volume, the authors extend the calculus of finite differences to Dirac's equation. They obtain solutions for particles with negative mass that are completely equivalent to the solutions with p
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02-25006600[分機130、131]。
Advances in Imaging and Electron Physics
作者:Peter W. Hawkes (EDT); Martin Hy¨tch (EDT)  出版社:Academic Pr  出版日:2019/07/12 裝訂:精裝
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Advances in Imaging and Electron Physics
作者:Peter W. Hawkes (EDT); Martin Hy¨tch (EDT)  出版社:Academic Pr  出版日:2019/10/25 裝訂:精裝
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Advances in Imaging and Electron Physics
作者:Peter W. Hawkes (EDT); Valeriy A. Syrovoy; Mikhail A. Monastyrskiy (TRN)  出版社:Academic Pr  出版日:2011/06/21 裝訂:精裝
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended a
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Comparative Studies in Administration
This volume is intended as a contribution to the study of administration. The contributors represent several branches of social and behavioral sciences, including anthropology, economics, industrial m
定價:2750 元, 優惠價:1 2750
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