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David C. Joy

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出版日:1999/06/01 作者:Edgar Volkl; David C. Joy (EDT); Lawrence F. Allard (EDT); Edgar Volkl (EDT); Allard  出版社:Plenum Pub Corp  裝訂:精裝
Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's `how to' aspects
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Scanning Electron Microscopy and X-Ray Microanalysis
90 折
Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imag
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
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