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Quantitative Data Processing in Scanning Probe Microscopy

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出版日:2015/03/23 作者:Bert Voigtl?er  出版社:Springer Verlag  裝訂:精裝
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successful
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出版日:2007/01/30 作者:S. Morita (EDT)  出版社:Springer Verlag  裝訂:精裝
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM).
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出版日:2006/07/12 作者:A. Foster; W. Hofer  出版社:Springer Verlag  裝訂:精裝
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the sty
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出版日:2004/05/27 作者:M. Alexe (EDT); A. Gruverman (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric
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出版日:2014/03/31 作者:Lidia Bakota (EDT); Roland Brandt (EDT)  出版社:Springer Verlag  裝訂:精裝
Laser Scanning Microscopy and Quantitative Image Analysis of Neuronal Tissue brings together contributions from research institutions around the world covering pioneering applications in laser scannin
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出版日:2010/12/30 作者:Sergei V. Kalinin (EDT); Alexei Gruverman (EDT)  出版社:Springer Verlag  裝訂:平裝
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials,
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出版日:1999/01/01 作者:Ludwig Reimer; P. W. Hawkes (EDT)  出版社:Springer Verlag  裝訂:精裝
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and bac
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出版日:2008/11/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
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出版日:2008/03/05 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Masahiko Tomitori (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this tech
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出版日:2006/04/30 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The f
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出版日:2012/10/30 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2012/09/30 作者:Francesco Marinello (EDT); Daniele Passeri (EDT); Enrico Savio (EDT)  出版社:Springer Verlag  裝訂:精裝
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface
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Atomic Force Microscopy in Biomedical Research ─ Methods and Protocols
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出版日:2011/05/20 作者:Pier Carlo Braga (EDT); Davide Ricci (EDT)  出版社:Springer Verlag  裝訂:精裝
With its ability to explore the surface of the sample by means of a local scanning probe and its use of dedicated software allows to be visualize results, atomic force microscopy (AFM) has revolutioni
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出版日:2010/03/31 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2010/03/06 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2014/06/11 作者:Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer  出版社:Springer Verlag  裝訂:平裝
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major inst
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出版日:2012/05/14 作者:Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer  出版社:Springer Verlag  裝訂:精裝
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major inst
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出版日:2014/11/14 作者:Enrico Gnecco (EDT); Ernst Meyer (EDT)  出版社:Springer Verlag  裝訂:精裝
This book provides an updated review on the development of scanning probe microscopy and related techniques, and the availability of computational techniques not even imaginable a few decades ago. The
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出版日:2013/06/08 作者:Patrick Echlin; C. E. Fiori; Joseph Goldstein; David C. Joy; Dale E. Newbury  出版社:Springer Verlag  裝訂:平裝
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide
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出版日:2011/10/21 作者:Sascha Sadewasser (EDT); Thilo Glatzel (EDT)  出版社:Springer Verlag  裝訂:精裝
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and descri
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出版日:2011/03/22 作者:Stephen J. Pennycook (EDT)  出版社:Springer Verlag  裝訂:平裝
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringin
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出版日:2008/12/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2008/03/15 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Masahiko Tomitori (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this tech
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2004/03/05 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Sumio Hosaka (EDT)  出版社:Springer Verlag  裝訂:精裝
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industr
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出版日:2017/12/16 作者:Joseph Goldstein; Dale Newbury; David C. Joy; Joseph Michael; Nicholas W. M. Ritchie  出版社:Springer Verlag  裝訂:精裝
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-
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出版日:2008/12/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2008/03/05 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Masahiko Tomitori (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this tech
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2018/03/19 作者:Sascha Sadewasser (EDT); Thilo Glatzel (EDT)  出版社:Springer Verlag  裝訂:精裝
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and nume
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出版日:2017/05/03 作者:Nobuo Tanaka  出版社:Springer Verlag  裝訂:精裝
In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focu
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出版日:2013/10/31 作者:David C. Joy  出版社:Springer Verlag  裝訂:平裝
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (H
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出版日:2012/10/28 作者:Shinya InouT; Kenneth R. Spring  出版社:Springer Verlag  裝訂:平裝
The current edition of Video Microscopy has been totally revised to reflect the advances in the tools for electronic imaging, processing, recording, and analysis, as well as applications that are bein
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Quantitative Evaluation of Fire and Ems Mobilization Times
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出版日:2012/06/15 作者:Robert Upson; Kathy A. Notarianni  出版社:Springer Verlag  裝訂:平裝
Quantitative Evaluation of Fire and EMS Mobilization Times presents comprehensive empirical data on fire emergency and EMS call processing and turnout times, and aims to improve the operational benchm
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出版日:2000/10/01 作者:Chunli Bai  出版社:Springer Verlag  裝訂:平裝
This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and me
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出版日:2013/07/31 作者:Jonathan Mamou (EDT); Michael L. Oelze (EDT)  出版社:Springer Verlag  裝訂:精裝
Due to parallel advances in signal processing and computer hardware in the last 15 years, quantitative ultrasound techniques have reached maturity, allowing for the construction of quantitative maps o
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出版日:2011/02/25 作者:Weronica Walkosz  出版社:Springer Verlag  裝訂:精裝
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as we
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出版日:2006/08/30 作者:James B. Pawley (EDT)  出版社:Springer Verlag  裝訂:精裝
This third edition of a classic text in biological microscopy includes detailed descriptions and in-depth comparisons of parts of the microscope itself, digital aspects of data acquisition and propert
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出版日:2002/07/01 作者:M. A. Hayat  出版社:Springer Verlag  裝訂:精裝
Hayat (Kean U.) provides laboratory protocols for the molecular investigation of diseases. The chemical and physical principles of using microwave heating for processing tissues for microscopy is expl
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Big Data 2.0 Processing Systems ― A Survey
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出版日:2016/09/05 作者:Sherif Sakr  出版社:Springer Verlag  裝訂:平裝
This book provides readers the “big picture” and a comprehensive survey of the domain of big data processing systems. For the past decade, the Hadoop framework has dominated the world of big data proc
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Nanophysics for Energy Efficiency
90 折
出版日:2015/08/03 作者:Rui Filipe Lobo  出版社:Springer Verlag  裝訂:平裝
This book provides a succinct account of the ways in which nano technology is being applied to improve energy efficiency. The coverage includes current scanning probe techniques for electrical energy
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出版日:2014/11/13 作者:Fatos Xhafa (EDT); Leonard Barolli (EDT); Admir Barolli (EDT); Petraq Papajorgji (EDT)  出版社:Springer Verlag  裝訂:精裝
This book covers the latest advances in Big Data technologies and provides the readers with a comprehensive review of the state-of-the-art in Big Data processing, analysis, analytics, and other relate
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