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【簡體曬書區】 單本79折,5本7折,活動好評延長至5/31,趕緊把握這一波!

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2016年以前 (2)

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Edited by Peter Børgesen 、John C. Coburn 、William F. Filter 、John E. Sanchez、Jr. 、Kenneth P. Rodbell (1)
Edited by Peter Børgesen 、John E. Sanchez、Jr. 、Paul H. Townsend 、Timothy P. Weihs (1)

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Thin Films:Stresses and Mechanical Properties IV:VOLUME308
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1.Thin Films:Stresses and Mechanical Properties IV:VOLUME308

作者:Edited by Peter Børgesen ; John E. Sanchez; Jr. ; Paul H. Townsend ; Timothy P. Weihs  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1993/10/27 裝訂:平裝
Proceedings of the title symposium, held at the 1993 Spring Meeting of the MRS in San Francisco. The papers are arranged in nine sections following the topical outline upon which the symposium was org
定價:1665 元, 優惠價:9 1499
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Materials Reliability in Microelectronics IV:VOLUME338
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2.Materials Reliability in Microelectronics IV:VOLUME338

Proceedings from the Materials Research Society symposium held in San Francisco, April 1994. Invited and contributed papers cover oxides, thin films, experimental techniques, stress in semiconductors
定價:1665 元, 優惠價:9 1499
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