ADVANCED CHARACTERIZATION TECHNIQUES FOR THIN FILMSOLAR CELLS
商品資訊
ISBN13：9783527410033
出版社：JOHN WILEY & SONS;LTD
作者：ABOU-RAS
出版日：2011/03/18
裝訂／頁數：精裝／583頁
商品簡介
They focus on emerging, specialized techniques that are new to the field of photovoltaics yet have a proven relevance. However, since new methods need to be judged according to their implications for photovoltaic devices, a clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method.
The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. Furthermore, they deal with specific device-related topics and include a selection of material and surface/interface analysis methods that have recently proven their relevance. Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D.
For students in physics, solid state physicists, materials scientists, PhD students in material sciences, materials institutes, semiconductor physicists, and those working in the semiconductor industry, as well as being suitable as supplementary reading in related courses.
作者簡介
Daniel Abou-Ras is senior scientist at the Helmholtz Center Berlin for Materials and Energy. He obtained his PhD at ETH Zurich, Switzerland. In 2005, he earned the MRS Graduate Student Gold Award at the MRS Spring Meeting. His research interests are scanning as well as transmission electron microscopy techniques applied on thin-film solar cells. Dr. Abou-Ras has organized various Young Scientist Tutorials on characterization techniques for thin film solar cells held at MRS and E-MRS Meetings.
Thomas Kirchartz is a scientist at the Institute of Energy at the research center in Julich. He obtained his Dipl. Ing. degree from the University of Stuttgart for work on the electroluminescence of solar cells in 2006 and his Dr. Ing. from the RWTH Aachen in 2009 for work on a detailed balance theory of solar cells. Dr. Kirchartz participated as instructor in two Young Scientist Tutorials on characterization techniques for thin film solar cells and was awarded a Graduate Student Award of the European Material Research Society.
目次
List of Contributors.
Preface.
List of Contributors.
Acknowledgments.
Abbreviations.
Part One Introduction.
1 Introduction to Thin-Film Photovoltaics (Thomas Kirchartz and Uwe Rau).
1.1 Introduction.
1.2 The Photovoltaic Principle.
1.3 Functional Layers in Thin-Film Solar Cells.
1.4 Comparison of Various Thin-Film Solar-Cell Types.
1.5 Conclusions.
References.
Part Two Device Characterization.
2 Fundamental Electrical Characterization of Thin-Film Solar Cells (Thomas Kirchartz, Kaining Ding, and Uwe Rau).
2.1 Introduction.
2.2 Current/Voltage Curves.
2.3 Quantum Efficiency Measurements.
References.
3 Electroluminescence Analysis of Solar Cells and Solar Modules (Thomas Kirchartz, Anke Helbig, Bart E. Pieters, and Uwe Rau).
3.1 Introduction.
3.2 Basics.
3.3 Spectrally Resolved Electroluminescence.
3.4 Spatially Resolved Electroluminescence of c-Si Solar Cells.
3.5 Electroluminescence Imaging of Cu(In,Ga)Se2 Thin-Film Modules.
3.6 Modeling of Spatially Resolved Electroluminescence.
References.
4 Capacitance Spectroscopy of Thin-Film Solar Cells (Jennifer Heath and Pawel Zabierowski).
4.1 Introduction.
4.2 Admittance Basics.
4.3 Sample Requirements.
4.4 Instrumentation.
4.5 Capacitance–Voltage Profiling and the Depletion Approximation.
4.6 Admittance Response of Deep States.
4.7 The Influence of Deep States on CV Profiles.
4.8 DLTS.
4.9 Admittance Spectroscopy.
4.10 Drive Level Capacitance Profiling.
4.11 Photocapacitance.
4.12 The Meyer–Neldel Rule.
4.13 Spatial Inhomogeneities and Interface States.
4.14 Metastability.
References.
Part Three Materials Characterization.
5 Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field Optical Microscopy (Karsten Bittkau).
5.1 Introduction.
5.2 How Does a Scanning Near-Field Optical Microscope Work?
5.3 Light Scattering in the Wave Picture.
5.4 The Role of Evanescent Modes for Light Trapping.
5.5 Analysis of Scanning Near-Field Optical Microscopy Images by Fast Fourier Transformation.
5.6 How to Extract Far-Field Scattering Properties by Scanning Near-Field Optical Microscopy?
5.7 Conclusion.
References.
6 Spectroscopic Ellipsometry (Sylvain Marsillac, Michelle N. Sestak, Jian Li, and Robert W. Collins).
6.1 Introduction.
6.2 Theory.
6.3 Ellipsometry Instrumentation.
6.4 Data Analysis.
6.5 RTSE of Thin Film Photovoltaics.
6.6 Summary and Future.
6.7 Definition of Variables.
References.
7 Photoluminescence Analysis of Thin-Film Solar Cells (Thomas Unold and Levent Gütay).
7.1 Introduction.
7.2 Experimental Issues.
7.3 Basic Transitions.
7.4 Case Studies.
References.
8 Steady-State Photocarrier Grating Method (Rudolf Brüggemann).
8.1 Introduction.
8.2 Basic Analysis of SSPG and Photocurrent Response.
8.3 Experimental Setup.
8.4 Data Analysis.
8.5 Results.
8.6 Density-of-States Determination.
8.7 Summary.
References.
9 Time-of-Flight Analysis (Torsten Bronger).
9.1 Introduction.
9.2 Fundamentals of TOF Measurements.
9.3 Experimental Details.
9.4 Analysis of TOF Results.
References.
10 Electron-Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a-Si:H) (Klaus Lips, Matthias Fehr, and Jan Behrends).
10.1 Introduction.
10.2 Basics of ESR.
10.3 How to Measure ESR.
10.4 The g Tensor and Hyperfine Interaction in Disordered Solids.
10.5 Discussion of Selected Results.
10.6 Alternative ESR Detection.
10.7 Concluding Remarks.
References.
11 Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells (Sascha Sadewasser and Iris Visoly-Fisher).
11.1 Introduction.
11.2 Experimental Background.
11.3 Selected Applications.
11.4 Summary.
References.
12 Electron Microscopy on Thin Films for Solar Cells (Daniel Abou-Ras, Melanie Nichterwitz, Manuel J. Romero, and Sebastian S. Schmidt).
12.1 Introduction.
12.2 Scanning Electron Microscopy.
12.3 Transmission Electron Microscopy.
12.4 Sample Preparation Techniques.
References.
13 X-Ray and Neutron Diffraction on Materials for Thin-Film Solar Cells (Susan Schorr, Christiane Stephan, Tobias Törndahl, and Roland Mainz).
13.1 Introduction.
13.2 Diffraction of X-Rays and Neutron by Matter.
13.3 Neutron Powder Diffraction of Absorber Materials for Thin-Film Solar Cells.
13.4 Grazing Incidence X-Ray Diffraction (GIXRD).
13.5 Energy Dispersive X-Ray Diffraction (EDXRD).
References.
14 Raman Spectroscopy on Thin Films for Solar Cells (Jacobo Álvarez-García, Víctor Izquierdo-Roca, and Alejandro Pérez-Rodríguez).
14.1 Introduction.
14.2 Fundamentals of Raman Spectroscopy.
14.3 Vibrational Modes in Crystalline Materials.
14.4 Experimental Considerations.
14.5 Characterization of Thin-Film Photovoltaic Materials.
14.6 Conclusions.
References.
15 Soft X-Ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces (Marcus Bär, Lothar Weinhardt, and Clemens Heske).
15.1 Introduction.
15.2 Characterization Techniques.
15.3 Probing the Chemical Surface Structure: Impact of Wet Chemical Treatments on Thin-Film Solar Cell Absorbers.
15.4 Probing the Electronic Surface and Interface Structure: Band Alignment in Thin-Film Solar Cells.
15.5 Summary.
References.
16 Elemental Distribution Profiling of Thin Films for Solar Cells (Volker Hoffmann, Denis Klemm, Varvara Efimova, Cornel Venzago, Angus A. Rockett, Thomas Wirth, Tim Nunney, Christian A. Kaufmann, and Raquel Caballero).
16.1 Introduction.
16.2 Glow Discharge-Optical Emission (GD-OES) and Glow Discharge-Mass Spectroscopy (GD-MS).
16.3 Secondary Ion Mass Spectrometry (SIMS).
16.4 Auger Electron Spectroscopy (AES).
16.5 X-Ray Photoelectron Spectroscopy (XPS).
16.6 Energy-Dispersive X-Ray Analysis on Fractured Cross Sections.
References.
17 Hydrogen Effusion Experiments (Wolfhard Beyer and Florian Einsele).
17.1 Introduction.
17.2 Experimental Setup.
17.3 Data Analysis.
17.4 Discussion of Selected Results.
17.5 Comparison with Other Experiments.
17.6 Concluding Remarks.
References.
Part Four Materials and Device Modeling.
18 Ab-Initio Modeling of Defects in Semiconductors (Karsten Albe, Péter Ágoston, and Johan Pohl).
18.1 Introduction.
18.2 Density Functional Theory and Methods.
18.3 Methods Beyond DFT.
18.4 From Total Energies to Materials. Properties.
18.5 Ab-initio Characterization of Point Defects.
18.6 Conclusions.
References.
19 One-Dimensional Electro-Optical Simulations of Thin-Film Solar Cells (Bart E. Pieters, Koen Decock, Marc Burgelman, Rolf Stangl, and Thomas Kirchartz).
19.1 Introduction.
19.2 Fundamentals.
19.3 Modeling Hydrogenated Amorphous and Microcrystalline Silicon.
19.4 Optical Modeling of Thin Solar Cells.
19.5 Tools.
References.
20 Two- and Three-Dimensional Electronic Modeling of Thin-Film Solar Cells (Ana Kanevce and Wyatt K. Metzger).
20.1 Introduction.
20.2 Applications.
20.3 Methods.
20.4 Examples.
20.5 Summary.
References.
Index.
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