NEW CHARACTERIZATION TECHNIQUES FOR THIN POLYMER FILMS

Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin polymer films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in-depth studies of thin polymer films. The techniques covered are divided into two groups--bulk property measurements and surface/interface property measurements--with chapters covering microdielectrometry, stress measurement by x-ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.

Microdielectrometry (D. Day).

Bending-Beam Characterization of Thin Polymer Films (H. Tong & K. Saenger).

Polymer Film Stress Measurement by X-Ray Diffraction (L. Nguyen).

Laser Interferometry: A Measurement Tool for Thin Film Polymer Properties and Processing Characteristics (K. Saenger & H. Tong).

Piezoelectric Resonators: Considerations for Use with Mechanically Lossy Media (K. Kanazawa).

Ion Beam Analysis of Thin Polymer Films (P. Green & B. Doyle).

Fluorescence Redistribution After Pattern Photobleaching (B. Smith).

Surface Sensors for Moisture and Stress Studies (L. Nguyen).

Photothermal Analysis of Thin Polymer Films( H. Coufal).

Thermally Stimulated Discharge Current Measurement for Thin Polymer Films (B. Chowdhury).

XPS/SIMS/AES for Surface and Interface Characterization of Thin Polymer Films (N. Chou).

Prospects for Examination of Polymer Molecules with Scanning Tunneling Microscope and Atomic Force Microscope (D. Reneker).

Adhesion Measurement of Thin Polymer Films by Indentation (M. Matthewson & J. Ritter).

Subject Index.