商品簡介
Reports on materials characterization techniques that use synchrotron radiation at a time when third-generation synchrotron facilities are being constructed and brought online in the US and elsewhere, and when synchrotron-based spectroscopic techniques are being combined with increasingly high-resolution microscopy to understand chemical and electronic properties by examining ever smaller domains of materials. The 37 papers cover the structure of reduced dimensional materials, magnetic materials, microscopy, topography, tomography, X-ray probes of solids, and characterizing materials with X-ray absorption. Reproduced from typescripts. Annotation c. by Book News, Inc., Portland, Or.
