商品簡介
Engineers at the M/A-COM Tyco Electronics revise the company's manual of the same title, which explains to engineers and managers how the design for reliability approach can enhance the concurrent design cycles. They argue that the stage gate process provides the maximum level of benefit to the design while minimizing the cycle time impact to that process, producing the highest levels of product reliability possible. The topics include understanding customer requirement, screening and monitoring, semiconductor process reliability, analytical physics, concepts in accelerated testing, and evaluating product risk. Annotation c. Book News, Inc., Portland, OR (booknews.com)
