Semiconductor Devices in Harsh Conditions

: Kirsten Weide-Zaage is senior lecturer (Privatdozent) in the field of microelectronics at the Faculty of Electrical Engineering and Computer Science of the Gottfried Wilhelm Leibniz Universitat in Hannover, Germany. She studied Physics with main topic Biophysics and made her PhD in Electrical Engineering. She is working since 1988 at the Faculty of Electrical Engineering and Computer Science from 1991 until 2014 at the Information Technology Laboratory as researcher and leader of the simulation group ‘Robust Electronics’ in the field interconnect and package reliability. Since 2015 she moved with her renamed group ‘Reliability: Simulation and Risk Analysis’ to the Institute of Microelectronic Systems, Architectures and System Section. She is author of more than 80 scientific articles, including journal and conference publications, book chapters, a book and invited papers. Malgorzata Chrzanowska-Jeske is Professor of Electrical and Computer Engineering, and Director of the VLSI & Emerging Technology Design Automation Laboratory at Portland State University. She joined the ECE Department at PSU in 1989 and was Department Chair from 2004 to 2010. Previously, she served on the faculty of the Technical University of Warsaw and as a design automation specialist at the Research and Production Center of Semiconductor Devices in Warsaw. She holds a M.S. degree in electronics engineering from the Technical University of Warsaw, Poland, and a Ph.D degree in electrical engineering from Auburn University, Alabama.