Introduction.- Principles of X-Ray Imaging.- Synchrotron Beamlines, Instrumentation and Contributions.- X-ray Single-Grating Interferometry.- Principles and State of the Art Of X-Ray Speckle-Based Imaging.- The Unified Modulated Pattern Analysis.- At-Wavelength Optics Characterisation Via X-Ray Speckle- And Grating-Based Unified Modulated Pattern Analysis.- 3d Virtual Histology Using X-Ray Speckle With The Unified Modulated Pattern Analysis.- Recent Developments and Ongoing Work In X-Ray Speckle-Based Imaging.- Summary, Conclusions and Outlook.- Appendices.
