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即日起~6/30,暑期閱讀書展,好書7折起

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商品類型

原文書 (8)
商品狀況

可訂購商品 (8)
庫存狀況

無庫存 (8)
商品定價

$800以上 (8)
出版日期

2024年 (1)
2016~2017 (1)
2016年以前 (6)
裝訂方式

平裝 (2)
精裝 (6)
作者

Stan Z. Li (2)
Li, Stan Z.,Jain, Anil K. (1)
Massimo Tistarelli (EDT)/ Stan Z. Li (EDT)/ Rama Chellappa (EDT) (1)
Stan Z. Li (EDT)/ Anil Jain (ADP) (1)
Stan Z. Li (EDT)/ Anil K. Jain (EDT) (1)
Stan Z. Li(EDI) (1)
S撊琦stien Marcel (EDT)/ Mark S. Nixon (EDT)/ Stan Z. Li (EDT) (1)
出版社/品牌

Springer-Verlag New York Inc (4)
Springer Verlag (2)
Springer London Ltd (1)
Springer Nature (1)

三民網路書店 / 搜尋結果

8筆商品,1/1頁
Markov Random Field Modeling in Image Analysis
作者:Stan Z. Li  出版社:Springer Verlag  出版日:2009/06/01 裝訂:平裝
Markov random field (MRF) theory provides a basis for modeling contextual constraints in visual processing and interpretation. It enables us to develop optimal vision algorithms systematically when us
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Markov Random Field Modeling in Image Analysis
作者:Stan Z. Li  出版社:Springer-Verlag New York Inc  出版日:2009/06/01 裝訂:精裝
Markov random field (MRF) theory provides a basis for modeling contextual constraints in visual processing and interpretation. It enables systematic development of optimal vision algorithms when used
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Face Recognition: The Deep Neural Network Approach
作者:Stan Z. Li(EDI)  出版社:Springer Nature  出版日:2024/01/04 裝訂:精裝
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Encyclopedia of Biometrics
作者:Stan Z. Li (EDT); Anil Jain (ADP)  出版社:Springer-Verlag New York Inc  出版日:2015/04/30 裝訂:精裝
This encyclopedia provides a comprehensive reference to topics in biometrics including concepts, modalities, algorithms, devices, systems, security, performance testing, applications and standardizati
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Face Recognition
作者:Li; Stan Z.; Jain; Anil K.  出版社:Springer London Ltd  出版日:2016/08/23 裝訂:平裝
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Face Recognition
作者:Stan Z. Li (EDT); Anil K. Jain (EDT)  出版社:Springer-Verlag New York Inc  出版日:2011/08/31 裝訂:精裝
This highly anticipated new edition provides a comprehensive account of face recognition research and technology, spanning the full range of topics needed for designing operational face recognition sy
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Remote Biometrics ─ For Surveillance and Security
作者:Massimo Tistarelli (EDT); Stan Z. Li (EDT); Rama Chellappa (EDT)  出版社:Springer Verlag  出版日:2009/07/31 裝訂:精裝
This comprehensive and innovative handbook covers aspects of biometrics from the perspective of recognizing individuals at a distance, in motion, and under a surveillance scenario. Features: Starts w
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Biometric Anti-Spoofing ― Trusted Biometrics Under Spoofing Attacks
作者:S撊琦stien Marcel (EDT); Mark S. Nixon (EDT); Stan Z. Li (EDT)  出版社:Springer-Verlag New York Inc  出版日:2014/08/01 裝訂:精裝
Presenting the first definitive study of the subject, this Handbook of Biometric Anti-Spoofing reviews the state of the art in covert attacks against biometric systems and in deriving countermeasures
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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