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Edited by David C. Paine 、John C. Bravman (1)
Edited by John C. Bravman 、Thomas N. Marieb 、James R. Lloyd 、Matt A. Korhonen (1)
Edited by John C. Bravman 、William D. Nix 、David M. Barnett 、David A. Smith (1)
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CAMBRIDGE UNIVERSITY PRESS (3)

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Laser Ablation for Materials Synthesis:VOLUME191
90折
作者:Edited by David C. Paine ; John C. Bravman  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1990/11/15 裝訂:平裝
Proceedings of the MRS symposium held April 1990, San Francisco, California. Annotation copyright Book News, Inc. Portland, Or.
無庫存,下單後進貨(到貨天數約30-45天)
定價:1665 元, 優惠價:9 1499
Thin Films::Stresses and Mechanical Properties I:VOLUME130
90折
作者:Edited by John C. Bravman ; William D. Nix ; David M. Barnett ; David A. Smith  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1989/04/13 裝訂:平裝
Fifty-six contributions from a symposium held November 1988, Boston, Mass. On important aspects of stresses and mechanical properties in thin film technologies and on experimental techniques for study
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定價:1665 元, 優惠價:9 1499
Materials Reliability in Microelectronics VIII:VOLUME516
90折
作者:Edited by John C. Bravman ; Thomas N. Marieb ; James R. Lloyd ; Matt A. Korhonen  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1998/11/11 裝訂:平裝
Novel measurement techniques, microstructural effects, reliability modelling, stress effects, advanced interconnect reliability, and adhesion and fracture are the concerns of the 49 papers. Invited pr
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定價:1665 元, 優惠價:9 1499

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