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Quantitative Data Processing in Scanning Probe Microscopy

1033753
1 / 25844
出版日:2012/11/27 作者:Petr Klapetek (EDT)  出版社:Elsevier Science Ltd  裝訂:精裝
Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of tr
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出版日:2018/01/01 作者:Petr Klapetek  出版社:Elsevier Science Ltd  裝訂:平裝
Scanning Probe Microscopy (SPM) techniques have potential to produce information about various local physical properties. Unfortunately, there is still a large gap between what is measured by commerci
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Scanning Probe Microscopy ― Atomic Force Microscopy and Scanning Tunneling Microscopy
90 折
出版日:2015/03/23 作者:Bert Voigtl?er  出版社:Springer Verlag  裝訂:精裝
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successful
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出版日:2007/01/30 作者:S. Morita (EDT)  出版社:Springer Verlag  裝訂:精裝
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM).
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Scanning Probe Microscopy
滿額折
出版日:2010/12/15 作者:Nikodem Tomczak (EDT); Kuan Eng Johnson Goh (EDT)  出版社:World Scientific Pub Co Inc  裝訂:精裝
Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumenta
優惠價: 9 3182
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出版日:2006/07/12 作者:A. Foster; W. Hofer  出版社:Springer Verlag  裝訂:精裝
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the sty
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Scanning Probe Microscopy In Industrial Applications: Nanomechanical Characterization
90 折
出版日:2013/11/22 作者:Yablon  出版社:John Wiley & Sons Inc  裝訂:精裝
"Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various indu
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Scanning Probe Microscopy and Spectroscopy:Methods and Applications
90 折
出版日:1994/09/29 作者:Roland Wiesendanger  出版社:Cambridge Univ Pr  裝訂:精裝
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
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Scanning Probe Microscopy and Spectroscopy:Methods and Applications
90 折
出版日:1994/09/29 作者:Roland Wiesendanger  出版社:Cambridge Univ Pr  裝訂:平裝
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
優惠價: 9 3568
無庫存
出版日:2004/05/27 作者:M. Alexe (EDT); A. Gruverman (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric
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Laser Scanning Microscopy and Quantitative Image Analysis of Neuronal Tissue
90 折
出版日:2014/03/31 作者:Lidia Bakota (EDT); Roland Brandt (EDT)  出版社:Springer Verlag  裝訂:精裝
Laser Scanning Microscopy and Quantitative Image Analysis of Neuronal Tissue brings together contributions from research institutions around the world covering pioneering applications in laser scannin
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Scanning Probe Microscopy Of Soft Matter - Fundamentals And Practices
90 折
出版日:2011/11/16 作者:Tsukruk  出版社:John Wiley & Sons Inc  裝訂:精裝
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,showing how to use the techniques for investigating physical and
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出版日:2010/12/30 作者:Sergei V. Kalinin (EDT); Alexei Gruverman (EDT)  出版社:Springer Verlag  裝訂:平裝
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials,
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Scanning Electrochemical Microscopy
90 折
出版日:2012/04/16 作者:Allen J. Bard (EDT); Michael V. Mirkin (EDT)  出版社:Taylor & Francis  裝訂:精裝
Because of its simplicity of use and quantitative results, Scanning Electrochemical Microscopy (SECM) has become an indispensable tool for the study of surface reactivity. The fast expansion of the SE
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出版日:1999/01/01 作者:Ludwig Reimer; P. W. Hawkes (EDT)  出版社:Springer Verlag  裝訂:精裝
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and bac
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Classic Grounded Theory ─ Applications With Qualitative and Quantitative Data
90 折
出版日:2016/05/05 作者:Judith A. Holton; Isabelle Walsh  出版社:SAGE Publications UK  裝訂:平裝
Classic Grounded Theory: Applications with Qualitative and Quantitative Data is unique in its presentation of classic grounded theory, from its historical origins to step-by-step guidance on how to ca
優惠價: 9 3510
庫存:1
Applied Scanning Probe Methods XI ─ Scanning Probe Microscopy Techniques
90 折
出版日:2008/11/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
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出版日:2006/04/30 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The f
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出版日:2010/03/31 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2010/03/06 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2008/03/05 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Masahiko Tomitori (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this tech
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出版日:2012/10/30 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2012/09/30 作者:Francesco Marinello (EDT); Daniele Passeri (EDT); Enrico Savio (EDT)  出版社:Springer Verlag  裝訂:精裝
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface
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Atomic Force Microscopy in Biomedical Research ─ Methods and Protocols
滿額折
出版日:2011/05/20 作者:Pier Carlo Braga (EDT); Davide Ricci (EDT)  出版社:Springer Verlag  裝訂:精裝
With its ability to explore the surface of the sample by means of a local scanning probe and its use of dedicated software allows to be visualize results, atomic force microscopy (AFM) has revolutioni
優惠:外文書周末優惠-單79雙75 優惠價: 79 6605
無庫存
出版日:2014/06/11 作者:Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer  出版社:Springer Verlag  裝訂:平裝
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major inst
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出版日:2012/05/14 作者:Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer  出版社:Springer Verlag  裝訂:精裝
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major inst
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出版日:2011/10/21 作者:Sascha Sadewasser (EDT); Thilo Glatzel (EDT)  出版社:Springer Verlag  裝訂:精裝
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and descri
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Scanning and Transmission Electron Microscopy ─ An Introduction
90 折
出版日:1993/09/23 作者:Stanley L. Flegler; John W. Heckman Jr.; Karen L. Klomparens  出版社:Oxford Univ Press USA  裝訂:精裝
This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Cle
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Introduction to Optical Microscopy
90 折
出版日:2019/09/30 作者:Jerome Mertz  出版社:Cambridge Univ Pr  裝訂:精裝
This fully updated, self-contained textbook covering modern optical microscopy equips students with a solid understanding of the theory underlying a range of advanced techniques. Two new chapters cover pump-probe techniques, and imaging in scattering media, and additional material throughout covers light-sheet microscopy, image scanning microscopy, and much more. An array of practical techniques are discussed, from classical phase contrast and confocal microscopy, to holographic, structured illumination, multi-photon, and coherent Raman microscopy, and optical coherence tomography. Fundamental topics are also covered, including Fourier optics, partial coherence, 3D imaging theory, statistical optics, and the physics of scattering and fluorescence. With a wealth of end-of-chapter problems, and a solutions manual for instructors available online, this is an invaluable book for electrical engineering, biomedical engineering, and physics students taking graduate courses on optical microsco
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Topographic Laser Ranging and Scanning
90 折
出版日:2017/12/05 作者:Edited by Jie Shan and Charles K. Toth  出版社:CRC Pr I Llc  裝訂:精裝
This book provides a comprehensive discussion of topographic LiDAR principles, systems, data acquisition, and data processing techniques. Ranging and scanning fundamentals, and broad, contemporary ana
Fundamentals of Friction and Wear on the Nanoscale
90 折
出版日:2014/11/14 作者:Enrico Gnecco (EDT); Ernst Meyer (EDT)  出版社:Springer Verlag  裝訂:精裝
This book provides an updated review on the development of scanning probe microscopy and related techniques, and the availability of computational techniques not even imaginable a few decades ago. The
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出版日:2013/06/08 作者:Patrick Echlin; C. E. Fiori; Joseph Goldstein; David C. Joy; Dale E. Newbury  出版社:Springer Verlag  裝訂:平裝
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide
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出版日:2013/01/28 作者:Heide Schatten (EDT)  出版社:Cambridge Univ Pr  裝訂:精裝
"Recent developments in scanning electron microscopy (SEM) have resulted in a wealth of new applications for cell and molecular biology, as well as related biological disciplines. It is now possible t
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出版日:2011/03/22 作者:Stephen J. Pennycook (EDT)  出版社:Springer Verlag  裝訂:平裝
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringin
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Applied Scanning Probe Methods XII—Characterization
90 折
出版日:2008/12/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Applied Scanning Probe Methods 13—Biomimetics and Industrial Applications
90 折
出版日:2008/12/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2008/10/29 作者:Alexander E. Knight (EDT)  出版社:Academic Pr  裝訂:精裝
Single molecule techniques, including single molecule fluorescence, optical tweezers, and scanning probe microscopy, allow for the manipulation and measurement of single biological molecules within a
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出版日:2008/03/15 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Masahiko Tomitori (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this tech
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Characterization of High Tc Materials and Devices by Electron Microscopy
90 折
出版日:2006/11/23 作者:Nigel D. Browning  出版社:Cambridge Univ Pr  裝訂:平裝
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier
優惠價: 9 1930
無庫存
出版日:2004/03/05 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Sumio Hosaka (EDT)  出版社:Springer Verlag  裝訂:精裝
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industr
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