Drawn for the July 2002 conference on the Isle of Bendor, these 24 papers discuss memory BISYT analysis and applications, memory and soft errors, reliability in railway and automotive systems, embedde
The 14 papers presented at the August 1999 workshop are grouped under the headings of architecture and applications, diagnosis and yield, memory testing topics, and new ideas in technology and design.
This thin volume contains the proceedings of the July 2003 conference in San Jose, California. It includes 13 papers on the following topics: DRAM for leading edge applications; fault analysis, test
