本書是闡述PSpice視窗版Design Center 的基本操作與分析模式的應用；模擬軟體 PSpice 與電力電子技術的結合與拓樸結構分析；可由文中來熟悉基本操作與各種分析模式之應用，學習建立自己的元件庫，模擬電力電子中的各種轉換器電路之設計，可避免實作電路的嘗試錯誤。適合作為大專三年級以上電機、電子、控制等科系之教材，及從事電力電子相關產業者之研發寶典。
First published in 1984, Magnetic Storm followed in the footsteps of the million-selling Views (1975). Once again employing a large format and lavish production to showcase the unique art and design o
Designed for middle school and early high school students, this new edition leads the market in content, features, and design. Now in full color, it has been completely revised and updated to reflect
陳盤：史記齊太公世家補注（上） 石璋如：殷虛文字甲編的五種分析 C. F. & F. M. Voegelin：Number in Hope P. L.-M. Serruys：Basic Problems Underlying the Process of Identification of the Chinese Graphs of the Shang Oracular Inscripti
本書係依據本身從事化工設計的經驗，參考近年來歐美化工界所推廣的製程安全設計的理念與方法，撰寫而成。全書共分為四章，第一章介紹本質安全設計；第二章介紹壓力疏解系統裝置與二般狀況下的設計方法，第三章介紹美國化學工程師學會所屬的緊急疏解系統設計院(Design Institute Emergency Relief Systems，簡稱DIERS)發展的新技術；第四章則為設計範例。
The textbook shows some signs of being used because there is a small dent on the spine. But other than that, the book feels like brand new and the pages are clean.
This text offers designers and engineers crucial knowledge concerning the atmosphere, the forces imposed on a structure by the wind, and the behavior of structures under the influence of these forces.
Optical communication using optical fibres as the transmission medium is essential to handling the massive growth of both telecom and datacom traffic. To fully realize the potential bandwidth availabl
Copyright: 2007Format: Cloth; 736 ppFor courses in Marketing Strategy, Marketing Management, and Strategic Marketing. The premier marketing strategy and management casebook in the worldRoger Kerin, So
In these proceedings for the August 2005 workshop, contributors describe their most recent work in what must be one of the most commercially applicable fields in computer science. Topics include nonvo
This thin volume contains the proceedings of the July 2003 conference in San Jose, California. It includes 13 papers on the following topics: DRAM for leading edge applications; fault analysis, test
