滿額折
Aberration-Corrected Analytical Electron Microscopy
商品資訊
ISBN13：9780470518519
出版社：John Wiley & Sons Inc
作者：Brydson
出版日：2011/09/23
裝訂／頁數：精裝／304頁
規格：23.5cm*15.9cm*1.9cm (高/寬/厚)
商品簡介
作者簡介
商品簡介
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
作者簡介
Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).
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