Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DiM)-related rule violations. The book also addresses small-delay defects (SDDs) and testing, which can cause immediate failures if introduced on both critical and non-critical paths in the circuit.

Sandeep Kumar Goel received the B. Tech. degree from the Institute of Engineering and Tec1ul0logy, Lucknow, in 1998, the M. Tech. degree from the Indian Institute of Technology, Delhi, in 1999, and the Ph.D. degree from the University of Twente, Enschede, Netherlands, in 2005. He is currently a principal engineer at LSI, Milpitas, California. He is a senior member of the IEEE.

Krishnendu Chakrabarty received the B. Tech. degree from the Indian Institute of Technology, Kharagpur, in 1990, as well as M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively. He is now Professor of Electrical and Computer Engineering at Duke University. He is also a Chair Professor of Software Theory in the School of Software, Tsinghua University, Beijing, China. Dr. Chakrabarty is a recipient of the National Science Foundation Early Faculty (CAREER) award, the Office of Naval Research Young Investigator award, the Humboldt Research Fellowship, and several best papers awards at IEEE conferences.