商品簡介
An interdisciplinary exploration of the applicability of different dynamical imaging, diffraction, and spectroscopy methods to various materials and problems. Emphasizing the imaging techniques, the 30 papers provide such perspectives as the HVEM study of high-temperature deformation of ceramic and metallic materials, high-voltage electron microscopy observations of deformity and fracture in multilayered materials, Brownian motion and the coarsening of domain boundaries on (7x7)-Si(111), electromigration-induced void dynamics, and the kinetic study of the passive film on 304 stainless steel using a scanning tunneling microscope. The CiP data shows the title In situ electron tunneling . . . Annotation c. by Book News, Inc., Portland, Or.
