商品簡介
Smith (Arizona State U.) has compiled 42 papers highlighting recent developments and expanded applications involving such atomic-resolution imaging methods as scanning tunneling microscopy and high-resolution electron microscopy to surfaces and bulk defects. A sampling of the invited paper titles include: determination of atomic structure at surfaces and interfaces by high-resolution STEM, HRTEM studies of dislocations and interfaces in TiAl, Evolution of morphology during etching of Si, Atomic structure of interfaces in mazed Au bicrystals, and imaging the dimers in Si(111)7 x 7. The editor notes that international participation was high, particularly from Germany and Japan. Annotation c. by Book News, Inc., Portland, Or.
