商品簡介
In these proceedings from the November-December 2004 symposium, contributors describe their work in electron microscopy as it relates to materials science, such as atomic and subatomic imaging and spectroscopy, including a paper on materials analysis by aberration-corrected STEM, electron energy loss spectroscopy for sub-nanometer chemical and optical properties, including a paper on in-situ quantitative plasmon spectroscopic determination and imaging of multiple solid-state properties at the nanoscale, electron microscopy of molecular and atom-scale mechanical behavior, chemistry and structure including a paper on electron halographic characterization, three-dimensional nanoscale characterization, quantitative electron microscopy, including holography, dopant profiling and diffraction, imaging individual structures in bio- and nano-materials, and in-situ microscopy of deformation and growth, including those in liquids. Annotation c2005 Book News, Inc., Portland, OR (booknews.com)
