商品簡介
Physicists and electronic engineers in Australia and Britain survey processes of measuring materials, devices, and systems using terahertz frequency radiation. The topics are terahertz time-domain spectrometers, parameter extraction in time-domain spectrometers, metrology for time-domain spectrometers, evaluating uncertainty in time-domain spectroscopy, metrology for Fourier transform spectrometers, terahertz spectrometer calibration, terahertz imaging, metrology for vector network analyzers, terahertz optics, terahertz laser sources, and electronic sources of terahertz radiation and terahertz detectors. Annotation c2015 Ringgold, Inc., Portland, OR (protoview.com)
