商品簡介
Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods.
As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third and final part presents new and emerging methods of materials characterization, such as three-dimensional X-ray diffraction microscopy, in-situ Laue approaches and combined diffraction and tomography methods.
With all the chapters thoroughly revised and updated, and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.
作者簡介
Andreas Schreyer is Head of the Division Materials Physics and of the German Engineering Materials Science Center at the Helmholtz Center Geesthacht, Germany. He obtained his PhD and his Habilitation from the Ruhr University Bochum. In 2001 Andreas Schreyer became Professor at the University of Hamburg and Head of the Institute for Materials Research at the Helmholtz Center Geesthacht.
Helmut Clemens is Head of the Department of Physical Metallurgy and Materials Testing at the University of Leoben, Austria. After his PhD he joined Plansee AG, Austria, as Head of the Advanced Materials R&D group in 1990, and gained his lecturing qualification in 1997. From 1998 to 2000 he was Professor for Metallic Materials at the Institute for Physical Metallurgy, University of Stuttgart, Germany, before moving to the Institute for Materials Research at the Helmholtz Center Geesthacht, in a joint appointment as Professor at the University of Kiel.
