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Atom Probe Microscopy

1993
1 / 50
出版日:2014/06/11 作者:Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer  出版社:Springer Verlag  裝訂:平裝
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major inst
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出版日:2012/05/14 作者:Baptiste Gault; Michael P. Moody; Julie M. Cairney; Simon P. Ringer  出版社:Springer Verlag  裝訂:精裝
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major inst
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Atom-Probe Field Ion Microscopy:Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution
90 折
出版日:2005/09/15 作者:Tien T. Tsong  出版社:Cambridge Univ Pr  裝訂:平裝
Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analysing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy - for example the study of the behaviour of single atoms and clusters on a solid surface. The elegant development of the field ion microscope with the atom probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid su
優惠價: 9 2573
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出版日:1996/11/28 作者:M. K. Miller; A. Cerezo; M. G. Hetherington; G. D. W. Smith  出版社:Oxford Univ Pr on Demand  裝訂:精裝
The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale sc
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出版日:2015/03/23 作者:Bert Voigtl?er  出版社:Springer Verlag  裝訂:精裝
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successful
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出版日:2007/01/30 作者:S. Morita (EDT)  出版社:Springer Verlag  裝訂:精裝
Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM).
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出版日:2011/10/21 作者:Sascha Sadewasser (EDT); Thilo Glatzel (EDT)  出版社:Springer Verlag  裝訂:精裝
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and descri
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Scanning Probe Microscopy
滿額折
出版日:2010/12/15 作者:Nikodem Tomczak (EDT); Kuan Eng Johnson Goh (EDT)  出版社:World Scientific Pub Co Inc  裝訂:精裝
Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumenta
優惠價: 9 3182
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出版日:2006/07/12 作者:A. Foster; W. Hofer  出版社:Springer Verlag  裝訂:精裝
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the sty
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出版日:2013/11/22 作者:Yablon  出版社:John Wiley & Sons Inc  裝訂:精裝
"Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various indu
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出版日:2004/05/27 作者:M. Alexe (EDT); A. Gruverman (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric
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出版日:2018/03/19 作者:Sascha Sadewasser (EDT); Thilo Glatzel (EDT)  出版社:Springer Verlag  裝訂:精裝
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and nume
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出版日:2016/08/27 作者:David J. Larson; Ty J. Prosa; Robert M. Ulfig; Brian P. Geiser; Thomas F. Kelly  出版社:Springer Verlag  裝訂:平裝
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundament
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出版日:2011/11/16 作者:Tsukruk  出版社:John Wiley & Sons Inc  裝訂:精裝
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,showing how to use the techniques for investigating physical and
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出版日:2010/12/30 作者:Sergei V. Kalinin (EDT); Alexei Gruverman (EDT)  出版社:Springer Verlag  裝訂:平裝
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials,
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出版日:1994/09/29 作者:Roland Wiesendanger  出版社:Cambridge Univ Pr  裝訂:精裝
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
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Scanning Probe Microscopy and Spectroscopy:Methods and Applications
90 折
出版日:1994/09/29 作者:Roland Wiesendanger  出版社:Cambridge Univ Pr  裝訂:平裝
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
優惠價: 9 3568
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出版日:2022/04/30 作者:Thomas F. Kelly  出版社:Cambridge Univ Pr  裝訂:精裝
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
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出版日:2019/09/30 作者:Jerome Mertz  出版社:Cambridge Univ Pr  裝訂:精裝
This fully updated, self-contained textbook covering modern optical microscopy equips students with a solid understanding of the theory underlying a range of advanced techniques. Two new chapters cover pump-probe techniques, and imaging in scattering media, and additional material throughout covers light-sheet microscopy, image scanning microscopy, and much more. An array of practical techniques are discussed, from classical phase contrast and confocal microscopy, to holographic, structured illumination, multi-photon, and coherent Raman microscopy, and optical coherence tomography. Fundamental topics are also covered, including Fourier optics, partial coherence, 3D imaging theory, statistical optics, and the physics of scattering and fluorescence. With a wealth of end-of-chapter problems, and a solutions manual for instructors available online, this is an invaluable book for electrical engineering, biomedical engineering, and physics students taking graduate courses on optical microsco
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Atomic Force Microscopy in Biomedical Research ─ Methods and Protocols
滿額折
出版日:2011/05/20 作者:Pier Carlo Braga (EDT); Davide Ricci (EDT)  出版社:Springer Verlag  裝訂:精裝
With its ability to explore the surface of the sample by means of a local scanning probe and its use of dedicated software allows to be visualize results, atomic force microscopy (AFM) has revolutioni
優惠價: 79 6605
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出版日:1999/01/01 作者:Ludwig Reimer; P. W. Hawkes (EDT)  出版社:Springer Verlag  裝訂:精裝
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and bac
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出版日:2014/11/14 作者:Enrico Gnecco (EDT); Ernst Meyer (EDT)  出版社:Springer Verlag  裝訂:精裝
This book provides an updated review on the development of scanning probe microscopy and related techniques, and the availability of computational techniques not even imaginable a few decades ago. The
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出版日:2012/09/30 作者:Francesco Marinello (EDT); Daniele Passeri (EDT); Enrico Savio (EDT)  出版社:Springer Verlag  裝訂:精裝
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface
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出版日:2008/10/29 作者:Alexander E. Knight (EDT)  出版社:Academic Pr  裝訂:精裝
Single molecule techniques, including single molecule fluorescence, optical tweezers, and scanning probe microscopy, allow for the manipulation and measurement of single biological molecules within a
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出版日:2014/05/31 作者:Michael K. Miller; Richard G. Forbes  出版社:Springer Verlag  裝訂:精裝
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.Readers will find descriptions of th
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出版日:2013/04/17 作者:Enrico Prati (EDT); Takahiro Shinada (EDT)  出版社:Taylor & Francis  裝訂:精裝
Single-Atom Nanoelectronics covers the fabrication of single-atom devices and related technology, as well as the relevant electronic equipment and the intriguing new phenomena related to single-atom a
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出版日:2010/03/31 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2010/03/06 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2008/11/01 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth vol
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出版日:2008/03/05 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT); Masahiko Tomitori (EDT)  出版社:Springer Verlag  裝訂:精裝
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this tech
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出版日:2006/04/30 作者:Bharat Bhushan (EDT); Harald Fuchs (EDT)  出版社:Springer Verlag  裝訂:精裝
Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The f
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Atom
滿額折
出版日:2018/12/11 作者:Jack Challoner  出版社:Mit Pr  裝訂:精裝
An accessible and engaging guide to the atom, the smallest, most fundamental constituent of matter.Until now, popular science has relegated the atom to a supporting role in defining the different chem
優惠價: 1 1518
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Legends of Tomorrow ─ The Atom
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出版日:2018/02/20 作者:Various (COR)  出版社:Dc Comics  裝訂:精裝
The greatest stories from one of DC's greatest heroes, the Atom, are collected here in LEGENDS OF TOMORROW: THE ATOM!From his debut in SHOWCASE to his membership amongst the mighty Justice League, Pro
優惠價: 79 451
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Multiphoton Microscopy and Fluorescence Lifetime Imaging
90 折
出版日:2018/01/22 作者:Karsten König  出版社:De Gruyter  裝訂:平裝
This monograph demonstrates the latest developments in two-photon fluorescence microscopy and second-harmonic generation (SHG) microscopy, including coverage of high-resolution microscopy methods, suc
優惠價: 9 9989
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Captain Atom ─ The Fall and Rise of Captain Atom
滿額折
出版日:2018/01/09 作者:Cary Bates; Greg Weisman; Will Conrad (ILT)  出版社:Dc Comics  裝訂:平裝
Captain Atom is dead...but his story is just beginning. Nathaniel Adam is one of Earth’s most powerful heroes...and one of the most dangerous. As Captain Atom, his body is in a constant s
優惠價: 79 511
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Optical Nanoscopy and Novel Microscopy Techniques
滿額折
出版日:2015/09/23 作者:Peng XI (EDT)  出版社:Taylor & Francis  裝訂:精裝
Many new methods in light and super-resolution microscopy have been developed over the last few years. This edited volume overviews the latest advances in microscopy, complete with experimental method
優惠價: 1 9450
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出版日:2012/11/20 作者:Michael J. Dykstra; Laura E. Reuss  出版社:Springer Verlag  裝訂:平裝
Electron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, light microscopy, physiology, and biochemistry, among other disciplines. It is also pre
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出版日:2012/11/05 作者:Natan T. Shaked (EDT); Zeev Zalevsky (EDT); Lisa L. Satterwhite (EDT)  出版社:Academic Pr  裝訂:精裝
Written by leading optical phase microscopy experts, this book is a comprehensive reference to phase microscopy and nanoscopy techniques for biomedical applications, including differential interferenc
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出版日:2012/10/30 作者:Bharat Bhushan (EDT)  出版社:Springer Verlag  裝訂:精裝
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapt
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出版日:2012/08/10 作者:Thomas Mueller-reichert (EDT); Paul Verkade (EDT)  出版社:Elsevier Science Serials  裝訂:精裝
The combination of electron microscopy with transmitted light microscopy (termed correlative light and electron microscopy; CLEM) has been employed for decades to generate molecular identification tha
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