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Standardized Testing

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出版日:2005/01/01 作者:Guo Li Qing Hua Da Xue  出版社:IEEE  裝訂:平裝
In these proceedings for the August 2005 workshop, contributors describe their most recent work in what must be one of the most commercially applicable fields in computer science. Topics include nonvo
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出版日:2004/07/09 作者:IEEE Solid-State Circuits Society  出版社:IEEE  裝訂:精裝
This thin volume contains the proceedings of the July 2003 conference in San Jose, California. It includes 13 papers on the following topics: DRAM for leading edge applications; fault analysis, test
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作者:Seyyed Abbas Mousavi  出版社:東華書局  裝訂:平裝
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