TOP
英國出版界指標大獎肯定!A.F. Steadman 獲年度作家,《史坎德》系列帶你踏上熱血奇幻旅程
縮小範圍
商品類型
商品定價
搜尋結果 /

X-Ray Optics and Microanalysis

25
1 / 1
出版日:2023/06/19 作者:Emil Zolotoyabko  出版社:De Gruyter  裝訂:平裝
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Design and development of multilayer X-ray optics
滿額折
出版日:2023/02/26 作者:Singam Srikanth Panini  出版社:Lightning Source Inc  裝訂:平裝
定價:1482 元
無庫存
出版日:2020/10/09 作者:Frieder Johannes Koch  出版社:Lightning Source Inc  裝訂:平裝
定價:2757 元
無庫存
出版日:2020/10/09 作者:Frieder Johannes Koch  出版社:Lightning Source Inc  裝訂:精裝
定價:3357 元
無庫存
出版日:2017/12/16 作者:Joseph Goldstein; Dale Newbury; David C. Joy; Joseph Michael; Nicholas W. M. Ritchie  出版社:Springer Verlag  裝訂:精裝
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
An Introduction to X-Ray Physics, Optics, and Applications
90 折
出版日:2017/06/06 作者:Carolyn Macdonald  出版社:Princeton Univ Pr  裝訂:精裝
In this book, Carolyn MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of
優惠價: 9 3078
無庫存
出版日:2013/06/08 作者:Patrick Echlin; C. E. Fiori; Joseph Goldstein; David C. Joy; Dale E. Newbury  出版社:Springer Verlag  裝訂:平裝
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2013/02/20 作者:Jay Theodore Cremer Jr.  出版社:Elsevier Science Ltd  裝訂:精裝
Covering a wide range of topics related to neutron and x-ray optics, this book explores the aspects of neutron and x-ray optics and their associated background and applications in a manner accessible
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2012/08/03 作者:Carlos A. Perez (EDT); Angelo Malachias De Souza (EDT)  出版社:Springer Verlag  裝訂:平裝
The 21st International Congress on X-ray Optics and Microanalysis (ICXOM21) is dedicated to bring together scientists and technologists involved in fundamental and applied research in the field of mic
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2010/11/23 作者:Patrick Echlin  出版社:Springer Verlag  裝訂:平裝
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geolog
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2010/05/12 作者:Melissa A. Denecke (EDT); Clive T. Walker (EDT)  出版社:Springer Verlag  裝訂:精裝
ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchr
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Handbook of Optics, Third Edition Volume V: Atmospheric Optics, Modulators, Fiber Optics, X-Ray and Neutron Optics
滿額折
出版日:2009/10/22 作者:BASS  出版社:Mcgraw-Hill; Inc.  裝訂:精裝
The most comprehensive and up-to-date optics resource available Prepared under the auspices of the Optical Society of America, the five carefully architected and cross-referenced volumes of the Handbo
優惠價: 79 4029
無庫存
出版日:2009/03/06 作者:Patrick Echlin  出版社:Springer Verlag  裝訂:精裝
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geolo
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2008/10/30 作者:A. Erko (EDT); M. Idir (EDT); T. Krist (EDT); A. G. Michette (EDT)  出版社:Springer Verlag  裝訂:精裝
This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imag
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2013/05/31 作者:Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin  出版社:Springer Verlag  裝訂:平裝
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical a
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2013/03/20 作者:Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori  出版社:Springer Verlag  裝訂:平裝
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors wit
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:1993/04/22 作者:Edited by David C. Sigee ; John Morgan ; Adrian T. Sumner ; Alice Warley  出版社:Cambridge University Press  裝訂:平裝
An up-to-date look at the use of X-ray microanalysis in biology and the potential of the technique for future research. The contributors tackle four major aspects of X-ray microanalysis--detection an
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2019/12/31 作者:Chris Jacobsen  出版社:Cambridge Univ Pr  裝訂:精裝
Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Measuring the Universe ― A Multiwavelength Perspective
90 折
出版日:2017/05/25 作者:George H. Rieke  出版社:Cambridge Univ Pr  裝訂:平裝
Astronomy is an observational science, renewed and even revolutionized by new developments in instrumentation. With the resulting growth of multiwavelength investigation as an engine of discovery, it is increasingly important for astronomers to understand the underlying physical principles and operational characteristics for a broad range of instruments. This comprehensive text is ideal for graduate students, active researchers and instrument developers. It is a thorough review of how astronomers obtain their data, covering current approaches to astronomical measurements from radio to gamma rays. The focus is on current technology rather than the history of the field, allowing each topic to be discussed in depth. Areas covered include telescopes, detectors, photometry, spectroscopy, adaptive optics and high-contrast imaging, millimeter-wave and radio receivers, radio and optical/infrared interferometry, and X-ray and gamma-ray astronomy, all at a level that bridges the gap between the
優惠價: 9 2267
無庫存
出版日:2017/01/31 作者:David Attwood  出版社:Cambridge Univ Pr  裝訂:精裝
With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2012/07/31 作者:Jay Theodore Cremer Jr.  出版社:Elsevier Science Serials  裝訂:精裝
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership acr
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
出版日:2012/07/02 作者:Jay Theodore Cremer Jr. (EDT)  出版社:Elsevier Science Serials  裝訂:精裝
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership acr
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
Handbook of X-Ray Astronomy
90 折
出版日:2011/11/21 作者:Keith Arnaud  出版社:Cambridge Univ Pr  裝訂:精裝
Modern x-ray data, available through online archives, are important for many astronomical topics. However, using these data requires specialized techniques and software. Written for graduate students, professional astronomers and researchers who want to start working in this field, this book is a practical guide to x-ray astronomy. The handbook begins with x-ray optics, basic detector physics and CCDs, before focussing on data analysis. It introduces the reduction and calibration of x-ray data, scientific analysis, archives, statistical issues and the particular problems of highly extended sources. The book describes the main hardware used in x-ray astronomy, emphasizing the implications for data analysis. The concepts behind common x-ray astronomy data analysis software are explained. The appendices present reference material often required during data analysis.
優惠價: 9 2105
無庫存
出版日:2010/04/30 作者:Pramod K. Rastogi (EDT); Erwin Hack (EDT)  出版社:Springer Verlag  裝訂:平裝
Phase plays an important role in all branches of optics and imaging and in all wavelength ranges from x-ray to millimetre-waves. The key topics of the conference are therefore phase control and advanc
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
  • 25
    1

暢銷榜

客服中心

收藏

會員專區