MICROBEAM ANALYSIS
商品資訊
ISBN13:9780471186311
出版社:JOHN WILEY & SONS;LTD
作者:ETZ
出版日:1995/07/31
裝訂/頁數:平裝/461頁
定價
:NT$ 14263 元優惠價
:
90 折 12837 元
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商品簡介
作者簡介
目次
商品簡介
This Proceeding of the 29th Annual meeting of the Microbeam Analysis Society contains the most current new developments in all techniques of microscopic analysis and related topics.
作者簡介
Edgar S. Etz is the author of Microbeam Analysis-1995, published by Wiley.
目次
PRESIDENTIAL SYMPOSIUM ON EMERGING DETECTOR TECHNOLOGY IN MICROANALYSIS
Low Temperature X-Ray Detectors with 10-20 eV Resolution and High Count Rates
Status of Compound High -Z Semiconductor Detectors for X-Ray Spectroscopy
HIGHLIGHTS IN CLASSIC LIGHT MICROSCOPY
Authentication of Art Objects: Shroud of Turin
Analysis of the Tremolite/Actinolite Series using High Precision Refractive Index Measurements
MATRIX-ASSISTED LASER DESORPTION IONIZATION MASS SPECTROMETRY IN MICROANALYSIS
Fundamental Studies of Matrix-Assisted Laser Desorption Ionization
The Role of Solubility in the Analysis of Synthetic Polymer Materials by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry
SECONDARY ION MASS SPECTROMETRY
Molecular Surface Analysis by TOF-SIMS
The Depth Measurement of Craters Produced by Secondary Ion Mass Spectrometry--Results of a Stylus Profilometer Round-Robin Study
SCANNING PROBE MICROSCOPY
Spectroscopy and Dynamics of Nanostructured J-Aggregates Probed by Near-Field Scanning Optical Microscopy (NSOM)
Optical and Structural Properties of Langmuir-Blodgett Films at the Air/Water Interface and the Solid/Air Interface
MICROFLUORESCENCE/LUMINESCENCE INSTRUMENTATION AND APPLICATIONS
Quantitative Fluorescence Imaging of Thin Films using Tunable Filter Technology
INFRARED AND RAMAN MICROANALYSIS
Applications of a Novel Infrared Interferometric Technique for Rapidly Performing Simultaneous Chemical State Imaging and Spectroscopy
Infrared Microspectroscopy and Computer Library Searching
SAMPLE PREPARATION FOR MICROANALYSIS
Chemical Ion Milling of Materials
MICRO-XRD/XRF CHEMICAL STATE
Fabrication and Development of Tapered Capillary X-Ray Optics for Microbeam Analysis
DETECTION AND ANALYSIS OF SOFT X-RAYS
Analysis from X-Ray Emission Bands
QUANTITATIVE X-RAY MICROANALYSIS
A New Quantitative Procedure for Stratified Samples in EPMA
MICROANALYSIS FOR NANOTECHNOLOGY
The Analysis of Nanoscale Particles by Analytical Electron Microscopy
CHEMOMETRIC TECHNIQUES FOR SPECTRAL ANALYSIS
Numerical Methods for TOF-SIMS Analysis
ANALYTICAL ELECTRON MICROSCOPY IN THE MATERIALS SCIENCES
Integrated NanoAnalytical Techniques and Tele-Presence Microscopy at the ANL Advanced Analytical Electron Microscope
Calculation of Near Edge Structure
A Study of EELS Fine Structure in Three Chromium Carbides
ANALYTICAL ELECTRON MICROSCOPY IN THE BIOLOGICAL SCIENCES
Interactive Elemental Image Acquisition and Processing
WORKSHOP ON ELECTRON BEAM/SPECIMEN INTERACTION MODELING FOR METROLOGY AND MICROANALYSIS IN THE SCANNING ELECTRON MICROSCOPE, PART II
Workshop Report 1: Scanning Electron Microscope Metrology as Related to a Defined Edge Structure
COMPUTATIONAL METHODS IN MICROSCOPY
Electron Stopping Powers--A Progress Report
ADVANCES IN SCANNING ELECTRON MICROSCOPY
Low KV X-Ray Mapping in a FESEM
Contrast Mechanisms in the ESEM Analyzed and Enriched by Differential Hysteresis Image Processing
IMAGE PROCESSING AND MULTIVARIATE IMAGE ANALYSIS IN MICROSCOPY
An Overview of Multivariate Image Analysis
MICROPROBE APPLICATIONS IN MATERIALS SCIENCE
The Development of an Electronic Microscopy and Microanalysis Journal on the World Wide Web
MICROANALYTICAL APPLICATIONS IN THE GEOSCIENCES
Laser Microprobe Stable Isotopic Studies of Sulfide, Silicate and Carbonate Minerals
NEW AND EMERGING TECHNIQUES
Recent Developments in Curved Diffractors for Focussing X-Rays
Nondestructive Acoustic Inspection for Long-Term Reliability Studies of Power IC's
Low Temperature X-Ray Detectors with 10-20 eV Resolution and High Count Rates
Status of Compound High -Z Semiconductor Detectors for X-Ray Spectroscopy
HIGHLIGHTS IN CLASSIC LIGHT MICROSCOPY
Authentication of Art Objects: Shroud of Turin
Analysis of the Tremolite/Actinolite Series using High Precision Refractive Index Measurements
MATRIX-ASSISTED LASER DESORPTION IONIZATION MASS SPECTROMETRY IN MICROANALYSIS
Fundamental Studies of Matrix-Assisted Laser Desorption Ionization
The Role of Solubility in the Analysis of Synthetic Polymer Materials by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry
SECONDARY ION MASS SPECTROMETRY
Molecular Surface Analysis by TOF-SIMS
The Depth Measurement of Craters Produced by Secondary Ion Mass Spectrometry--Results of a Stylus Profilometer Round-Robin Study
SCANNING PROBE MICROSCOPY
Spectroscopy and Dynamics of Nanostructured J-Aggregates Probed by Near-Field Scanning Optical Microscopy (NSOM)
Optical and Structural Properties of Langmuir-Blodgett Films at the Air/Water Interface and the Solid/Air Interface
MICROFLUORESCENCE/LUMINESCENCE INSTRUMENTATION AND APPLICATIONS
Quantitative Fluorescence Imaging of Thin Films using Tunable Filter Technology
INFRARED AND RAMAN MICROANALYSIS
Applications of a Novel Infrared Interferometric Technique for Rapidly Performing Simultaneous Chemical State Imaging and Spectroscopy
Infrared Microspectroscopy and Computer Library Searching
SAMPLE PREPARATION FOR MICROANALYSIS
Chemical Ion Milling of Materials
MICRO-XRD/XRF CHEMICAL STATE
Fabrication and Development of Tapered Capillary X-Ray Optics for Microbeam Analysis
DETECTION AND ANALYSIS OF SOFT X-RAYS
Analysis from X-Ray Emission Bands
QUANTITATIVE X-RAY MICROANALYSIS
A New Quantitative Procedure for Stratified Samples in EPMA
MICROANALYSIS FOR NANOTECHNOLOGY
The Analysis of Nanoscale Particles by Analytical Electron Microscopy
CHEMOMETRIC TECHNIQUES FOR SPECTRAL ANALYSIS
Numerical Methods for TOF-SIMS Analysis
ANALYTICAL ELECTRON MICROSCOPY IN THE MATERIALS SCIENCES
Integrated NanoAnalytical Techniques and Tele-Presence Microscopy at the ANL Advanced Analytical Electron Microscope
Calculation of Near Edge Structure
A Study of EELS Fine Structure in Three Chromium Carbides
ANALYTICAL ELECTRON MICROSCOPY IN THE BIOLOGICAL SCIENCES
Interactive Elemental Image Acquisition and Processing
WORKSHOP ON ELECTRON BEAM/SPECIMEN INTERACTION MODELING FOR METROLOGY AND MICROANALYSIS IN THE SCANNING ELECTRON MICROSCOPE, PART II
Workshop Report 1: Scanning Electron Microscope Metrology as Related to a Defined Edge Structure
COMPUTATIONAL METHODS IN MICROSCOPY
Electron Stopping Powers--A Progress Report
ADVANCES IN SCANNING ELECTRON MICROSCOPY
Low KV X-Ray Mapping in a FESEM
Contrast Mechanisms in the ESEM Analyzed and Enriched by Differential Hysteresis Image Processing
IMAGE PROCESSING AND MULTIVARIATE IMAGE ANALYSIS IN MICROSCOPY
An Overview of Multivariate Image Analysis
MICROPROBE APPLICATIONS IN MATERIALS SCIENCE
The Development of an Electronic Microscopy and Microanalysis Journal on the World Wide Web
MICROANALYTICAL APPLICATIONS IN THE GEOSCIENCES
Laser Microprobe Stable Isotopic Studies of Sulfide, Silicate and Carbonate Minerals
NEW AND EMERGING TECHNIQUES
Recent Developments in Curved Diffractors for Focussing X-Rays
Nondestructive Acoustic Inspection for Long-Term Reliability Studies of Power IC's
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