X-RAY DIFFRACTION AT ELEVATED TEMPERATURES - A METHOD FOR IN SITU PROCESS ANALYSIS

In light of the growing importance and availability of intense x-ray sources and position-sensitive detectors, this book offers comprehensive treatment of the principles, instrumentation, and applications of x-ray diffraction at elevated temperatures. Coverage explores the uses of intense x-ray sources and position-sensitive detectors for assessing these sources, and offers comparisons with complementary thermal analysis techniques (differential scanning calorimetry, thermogravimetric analysis, thermal mechanical analysis) for carrying out phase identification, texture analysis, and grain size measurement by way of in situ process analysis at elevated temperatures in a broad range of fields, including crystallography, thermal analysis, materials science, chemical and electrical analysis.

From the Contents:
Review of X-ray Diffraction/
X-ray Diffraction at Elevated Temperatures Using Intense X-
ray Sources/
X-ray Diffraction at Elevated Temperatures Using Position-Sensitive
Detectors/
Instrumentation of X-ray Diffraction at Elevated Temperatures/
In Situ Process
Analysis at Elevated Temperatures/
Applications of X-ray Diffraction at Elevated
Temperatures/
Kinetic Study Using X-ray Diffraction at Elevated Temperatures