商品簡介
This volume contains papers and presentations from two symposia. The first group of papers examines electron crystallography and structural fingerprinting of nanocrystals using both precession electron diffraction and high-resolution transmission electron microscopy. An emerging consensus holds that precession electron diffraction and electron tomography are instrumental breakthroughs that will lead to ab ignitio determinations of unknowns, many of which may only exist as microcrystals. The second group of papers deals with the current lack of effective and robust measurement solutions for probing the structure of nanomaterials. Among the topics examined are x-ray/neutron scattering techniques, scanning probe microscopy for surface characterization, structural and compositional imagining in TEM, and local electrode atom probe. Annotation c2009 Book News, Inc., Portland, OR (booknews.com)
