商品簡介
The governing rationale of the reference is that characterizing and analyzing surfaces and interfaces should be pursued in the context of problem solving rather than relying on the capabilities of one or more particular techniques. Chemists, chemical engineers, materials scientists, and other researchers first detail a range of techniques and approaches, then discuss in turn the analysis of various materials typically using some combination of techniques. The topics include time-of-flight secondary ion mass spectrometry, synchrotron-based techniques, in-depth analysis and profiling, characterizing nanostructured materials, problem-solving methods in metallurgy with surface analysis, composites, the surface analysis of biomaterials, and electron spectroscopy in corrosion science. No date is cited for the first edition. Annotation c2009 Book News, Inc., Portland, OR (booknews.com)
