With the continuing advancement of semi-conductors, the protection against electrostatic discharge (ESD), the event in which a finite amount of charge is transferred resulting more than 35% of all chip damage and information loss, could not be of higher priority. This book examines ESD concepts, models, protection solutions, and design strategies for on-chip ESD structures. Written by experts in the field, it offers necessary information on the backgrounds, methods, and approaches to the design and development of ESD protection solutions crucial to modern and future electronics.
Juin J. Liou received his BS (honors), MS, and Ph.D in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the University of Central Florida (UCF), Orlando, where he is now Pegasus distinguished professor, Lockheed Martin St. Laurent professor, and UCF-Analog Devices fellow. Highly decorated and widely published, Dr. Liou holds eight US patents (with five more pending) and several honorary professorships. He is a fellow of IEEE, IET, and Singapore Institute of Manufacturing Technology, and a distinguished lecturer in the IEEE Electron Device Society and National Science Council.
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