Semiconductor Material And Device Characterization, Third Edition
商品資訊
ISBN13：9780471739067
出版社：John Wiley & Sons Inc
作者：Schroder
出版日：2006/01/11
裝訂／頁數：精裝／800頁
規格：23.5cm*15.9cm*3.8cm (高/寬/厚)
商品簡介
The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.
Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including:
In addition, readers will find fully updated and revised sections in each chapter.
Plus, two new chapters have been added:
Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.
An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
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