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【簡體曬書區】 單本79折,5本7折,活動好評延長至5/31,趕緊把握這一波!

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原文書 (2)

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可訂購商品 (2)

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無庫存 (2)

商品定價


$800以上 (2)

出版日期


2016年以前 (2)

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平裝 (1)
精裝 (1)

作者


Joseph Goldstein/ Dale E. Newbury/ David C. Joy/ Charles E. Lyman/ Patrick Echlin (1)
Joseph I. Goldstein (EDT)/ Dale E. Newbury/ Patrick Kchlin/ David C. Joy/ Charles E. Lyman/ Eric Lifshin/ Linda Sawyer/ Joseph R. Michael (1)

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Plenum Pub Corp (1)
Springer Verlag (1)

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2筆商品,1/1頁
Scanning Electron Microscopy and X-Ray Microanalysis

1.Scanning Electron Microscopy and X-Ray Microanalysis

作者:Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin  出版社:Springer Verlag  出版日:2013/05/31 裝訂:平裝
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical a
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Scanning Electron Microscopy and X-Ray Microanalysis

2.Scanning Electron Microscopy and X-Ray Microanalysis

Providing acomprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imag
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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