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熱搜： 佛法是科學的終極典範、 民主與兩岸動向、 老公怎麼還不去死、 爸爸的機械魚、 DragonMasters 1-23、 理想的讀本、 法律與人生(鄰居篇)、 永續發展相關規範與實務、 新基本小六法

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商品類型
原文書 （13）
商品狀況
可訂購商品 （13）
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無庫存 （13）
商品定價
$800以上 （13）
出版日期
2020~2021 （1）
2018~2019 （1）
2016~2017 （3）
2016年以前 （8）
裝訂方式
精裝 （13）
作者
Brandon Noia/ Krishnendu Chakrabarty （1）
Edited by Sandeep K. Goel and Krishnendu Chakrabarty （1）
Fangming Ye/ Zhaobo Zhang/ Krishnendu Chakrabarty/ Xinli Gu （1）
Kai Hu/ Krishnendu Chakrabarty/ Tsung-Yi Ho （1）
Mohamed Ibrahim and Krishnendu Chakrabarty （1）
Mohammad Tehranipoor/ Ke Peng/ Krishnendu Chakrabarty （1）
Partha Pratim Pande (EDT)/ Amlan Ganguly (EDT)/ Krishnendu Chakrabarty (EDT) （1）
Qing Duan/ Krishnendu Chakrabarty/ Jun Zeng （1）
Ran Wang/ Krishnendu Chakrabarty （1）
Sudarshan Bahukudumbi/ Krishnendu Chakrabarty （1）
Sukanta Bhattacharjee/ Bhargab B. Bhattacharya/ Krishnendu Chakrabarty （1）
Yan Luo/ Krishnendu Chakrabarty/ Tsung-Yi Ho （1）
Yang Zhao/ Krishnendu Chakrabarty （1）
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出版社/品牌
Springer Verlag （9）
Artech House （1）
CRC Pr I Llc （1）
CRC Press UK （1）
River Publishers （1）

三民網路書店 / 搜尋結果

共13筆商品，1/1頁
Design-for-Test and Test Optimization Techniques for TSV-Based 3D Stacked ICs
1.

Design-for-Test and Test Optimization Techniques for TSV-Based 3D Stacked ICs

作者：Brandon Noia; Krishnendu Chakrabarty  出版社：Springer Verlag  出版日：2013/11/30 裝訂：精裝
This volume encompasses the latest, innovative methods of testing three-dimensional integrated circuits, incorporating pre-bond and post-bond tests as well as the test optimization and scheduling nece
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Wafer-Level Testing and Test During Burn-In for Integrated Circuits
2.

Wafer-Level Testing and Test During Burn-In for Integrated Circuits

作者：Sudarshan Bahukudumbi; Krishnendu Chakrabarty  出版社：Artech House  出版日：2010/02/28 裝訂：精裝
This analysis of methods for subjecting integrated circuits and semiconductor devices to electrical testing and stress testing will serve as a tutorial for engineers working with automatic test equipm
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Testing of Interposer-based 2.5d Integrated Circuits
3.

Testing of Interposer-based 2.5d Integrated Circuits

作者：Ran Wang; Krishnendu Chakrabarty  出版社：Springer Verlag  出版日：2017/03/29 裝訂：精裝
This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various chall
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Design and Testing of Digital Microfluidic Biochips
4.

Design and Testing of Digital Microfluidic Biochips

作者：Yang Zhao; Krishnendu Chakrabarty  出版社：Springer Verlag  出版日：2012/07/24 裝訂：精裝
This book provides a comprehensive methodology for automated design, test and diagnosis, and use of robust, low-cost, and manufacturable digital microfluidic systems. It focuses on the development of
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Optimization of Trustworthy Biomolecular Quantitative Analysis Using Cyber-Physical Microfluidic Platforms
5.

Optimization of Trustworthy Biomolecular Quantitative Analysis Using Cyber-Physical Microfluidic Platforms

作者：Mohamed Ibrahim and Krishnendu Chakrabarty  出版社：CRC Pr I Llc  出版日：2020/06/12 裝訂：精裝
A microfluidic biochip is an engineered fluidic device that controls the flow of analytes, thereby enabling a variety of useful applications. According to recent studies, the fields that are best set
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Hardware/Software Co-Design and Optimization for Cyberphysical Integration in Digital Microfluidic Biochips
6.

Hardware/Software Co-Design and Optimization for Cyberphysical Integration in Digital Microfluidic Biochips

作者：Yan Luo; Krishnendu Chakrabarty; Tsung-Yi Ho  出版社：Springer Verlag  出版日：2014/08/22 裝訂：精裝
This book describes a comprehensive framework for hardware/software co-design, optimization, and use of robust, low-cost, and cyberphysical digital microfluidic systems. Readers with a background in e
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Algorithms for Sample Preparation With Microfluidic Lab-on-chip
7.

Algorithms for Sample Preparation With Microfluidic Lab-on-chip

作者：Sukanta Bhattacharjee; Bhargab B. Bhattacharya; Krishnendu Chakrabarty  出版社：River Publishers  出版日：2019/03/30 裝訂：精裝
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Test and Diagnosis for Small-Delay Defects
8.

Test and Diagnosis for Small-Delay Defects

作者：Mohammad Tehranipoor; Ke Peng; Krishnendu Chakrabarty  出版社：Springer Verlag  出版日：2011/09/30 裝訂：精裝
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactur
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Data-driven Optimization and Knowledge Discovery for an Enterprise Information System
9.

Data-driven Optimization and Knowledge Discovery for an Enterprise Information System

作者：Qing Duan; Krishnendu Chakrabarty; Jun Zeng  出版社：Springer Verlag  出版日：2015/06/29 裝訂：精裝
This book provides a comprehensive set of optimization and prediction techniques for an enterprise information system. Readers with a background in operations research, system engineering, statistics,
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Computer-aided Design of Microfluidic Very Large Scale Integration Mvlsi Biochips ― Design Automation, Testing, and Design-for-testability
10.

Computer-aided Design of Microfluidic Very Large Scale Integration Mvlsi Biochips ― Design Automation, Testing, and Design-for-testability

作者：Kai Hu; Krishnendu Chakrabarty; Tsung-Yi Ho  出版社：Springer Verlag  出版日：2017/04/18 裝訂：精裝
This book provides a comprehensive overview of flow-based, microfluidic VLSI. The authors describe and solve in a comprehensive and holistic manner practical challenges such as control synthesis, wash
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Knowledge-driven Board-level Functional Fault Diagnosis
11.

Knowledge-driven Board-level Functional Fault Diagnosis

作者：Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu  出版社：Springer Verlag  出版日：2016/08/29 裝訂：精裝
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Reade
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Design Technologies for Green and Sustainable Computing Systems
12.

Design Technologies for Green and Sustainable Computing Systems

作者：Partha Pratim Pande (EDT); Amlan Ganguly (EDT); Krishnendu Chakrabarty (EDT)  出版社：Springer Verlag  出版日：2013/07/30 裝訂：精裝
This book details design technologies for green and sustainable computing. It examines the challenges of power efficiency and sustainability in various contexts, including system design, computer arch
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
13.

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

作者：Edited by Sandeep K. Goel and Krishnendu Chakrabarty  出版社：CRC Press UK  出版日：2012/03/15 裝訂：精裝
Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of m
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