商品簡介
Contains an invaluable collection of research grade XPS spectra, including comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported.
* Presents XPS spectra from pure polymers and X-ray induced damage studies of polymers
* Vertical and horizontal differential charging effects have been eliminated by using the flood-gun-mesh-screen system
* All spectra were obtained under everyday conditions, allowing users to compare directly with in-house spectra
* Self-consistent methodology that maximises reliablility and minimizes errors
* Overlays of high resolution spectra before and after long-term exposure to monochromatic X-rays
* Valence band spectra of pure polymers which serve as material fingerprints
作者簡介
B. Vincent Crist XPS International, Ames, Iowa
目次
ORGANIZATION AND DETAILS OF SPECTRAL SETS.
Alphabetical Organization of Spectra.
Contents of Each Set of Spectra.
Philosophy of Data Collection Methods.
Peak-Fitting (Curve-Fitting) of High Energy Resolution Spectra.
Charge Compensation of Insulating Materials.
Abbreviations Used.
INSTRUMENT AND ANALYSIS DETAILS USED TO MAKE XPS DATA.
Instrument Details.
Experimental Details.
Data Processing Details.
Sample Details.
Energy Resolution Details.
Energy Scale Reference Energies and Calibration Details.
Electron Counting and Instrument Response Function Details (for the X-probe system only).
Effects of Poorly Focusing the Distance between the Sample and the Electron Lens.
Quantitation Details and Choice of 'Sensitivity Exponents'.
Crude Tests of the Reliability of Relative Sensitivity Factors.
Traceability Details.
Reference Papers Describing the Capabilities of X-Probe, M-Probe, and S-Probe XPS Systems.
