Surface Chemical Analysis—Characterization Techniques for Plasma-deposited Organic Films

Edited by an internationally renowned expert in the field, this practical handbook covers all important methods for organic surface characterization, including x-ray photoelectron and x-ray absorption spectroscopy, secondary ion mass spectrometry, vibrational spectroscopy, and methods for surface energy measurement. Numerous multi-method case studies amply illustrate real-life applications such as adhesion, bio-compatibility, wettability, or permeation barriers, while the strategies for analysis are explained in detail.

Wolfgang E. S. Unger is the head of the surface and thin film analysis group at the Federal Institute of Materials Research (BAM) in Berlin. He obtained his diploma in physics in 1979 and his Ph.D. in physical chemistry in 1987. He joined the Central Institute of Physical Chemistry of the Academy of Sciences in Berlin in 1979, where he headed the photoelectron spectroscopy department from 1989 to 1991. From 1992 to 1997, he was senior scientist in the surface and interface analysis laboratory at BAM. He is convenor of the ISO Technical Committee 201 "Surface Chemical Analysis", and is guest reader in surface analysis at the Humboldt University and in polymer analysis at the Technical University, both in Berlin. He has published some 200 papers and contributed chapters to several edited books and to the an encyclopedia on the applications of surface analysis.