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英國出版界指標大獎肯定!A.F. Steadman 獲年度作家,《史坎德》系列帶你踏上熱血奇幻旅程
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出版日:1994/06/01 作者:Jaclyn Jeffrey (EDT); Baylor University Institute for Oral History (COR)  出版社:Rowman & Littlefield Pub Inc  裝訂:平裝
This book examines the interfaces of memory theory and oral history, which is based on human recollection. Essays examine the importance of memory and its reliability. Scholars from two fields, cognit
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English Language Testing in Hong Kong
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出版日:1994/03/01 作者:BOYLE; Joseph‧FALVEY; Peter eds.)  出版社:香港中文大學出版社  裝訂:平裝
This book examines English language testing in the Hong Kong context. It discusses the history of English language public examinations and issues related to medium of instruction, test reliability, or
優惠價: 9 954
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出版日:1992/07/01 作者:A. S. Argon (EDT)  出版社:Springer Verlag  裝訂:精裝
Fracture in structural materials remains a vital consideration in engineering systems, affecting the reliability of machines throughout their lives. Impressive advances in both the theoretical underst
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出版日:1980/12/18 作者:M. L. West (EDT)  出版社:Oxford Univ Pr on Demand  裝訂:精裝
The Oxford Classical Texts, or Scriptorum Classicorum Bibliotheca Oxoniensis, are renowned for their reliability and presentation. The series consists of a text without commentary but with a brief app
優惠價: 1 3600
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出版日:2009/04/08 作者:Mehul Naik  出版社:Cambridge Univ Pr  裝訂:精裝
The Advanced Metallization Conference - held in San Diego, California, and Tokyo, Japan - marked its 25th anniversary in 2008. These two sister conferences form a unique 'one conference at two sites' that focuses on the latest R&D and manufacturing results, as well as real-world integration and reliability data on the application of metallization and related technologies for advanced IC devices. Scientists and engineers from around the world came to listen and present state-of-the-art work in the field of ULSI interconnect technology including metallization, dielectrics, integration, packaging, design and vertical integration. A keynote address by Gary Patton, vice president, IBM Systems and Technology Group, on 'Leading-edge Silicon Technology through Innovation and Collaboration', is featured. Additional topics include: integration; metallization; materials and characterization; CMP and cleaning; 3D integration and packaging; low-k materials; and reliability and yield.
若需訂購本書,請電洽客服 02-25006600[分機130、131]。
基於RCM 的清潔能源發電設備檢修策略研究與實踐(簡體書)
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本書介紹了以可靠性為中心的維修(reliability-centered maintenance,RCM)的基本理論、分析方法和工程應用,從理論框架、工作程序、方法改進和實例驗證等方面進行了詳細闡述,豐富和發展了RCM在清潔能源發電設備維修決策制定領域的理論與方法體系。本書共9章,展示了清潔能源發電設備以可靠性為中心的維修(RCM)理論體系、分析方法、維修決策、系統開發等方面的研究成果。本書適合相關方向研究人員和工程技術人員參考借鑒,也可作為研究生掌握基礎理論和培養創新能力的讀物。
優惠價: 87 376
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A History of Photography in 50 Cameras
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出版日:2022/02/27 作者:Michael Pritchard  出版社:Firefly Books Ltd  裝訂:平裝
A History of Photography in 50 Cameras explores the 180-year story of perhaps the most widely used device ever built. It covers cameras in all forms, revealing the origins and development of each model and tracing the stories of the photographers who used and popularized them. Illustrated throughout with studio shots of all fifty cameras and a selection of iconic photographs made using them, it is the perfect companion guide for camera and photography enthusiasts alike. The cameras include: The Nikon F, the hockey puck that saved photographer Don McCullin's life when it stopped a sniper's bullet during the Vietnam War. Its indestructibility, reliability and interchangeable lenses made it a favored workhorse of photojournalists. The Leica M3-D was also favored by war photographers, including David Duncan Douglas, who used the camera during his coverage of the Korean and Vietnam Wars. In 2012, one of his four customized Leica cameras sold at auction for nearly $2 million. A Speed Gr
優惠價: 9 1710
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Advanced Metallization Conference 2005 (AMC 2005):VOLUME21
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出版日:2006/01/01 作者:Sywert H. Brongersma  出版社:Materials Research Society  裝訂:精裝
Technical leaders from around the world gather here to discuss developments in the areas of interconnect performance, advanced metallization, low-dielectric constant materials, barrier metallization, atomic layer deposition, advanced packaging and vertical integration. Both current state-of-the-art and ongoing challenges associated with multilevel interconnect are addressed. Included are papers on the latest developments in the integration of low-dielectric constant materials with copper-based metallization, and advances in the understanding of means by which process- or stress-induced damage can be mitigated and reliability of the interconnect system improved. Additional contributions discuss the design, development and modeling of advanced on-chip and multichip interconnect architectures and real-world implementation of optimized designs, materials and processes for production of leading-edge microelectronic devices.
優惠價: 9 1345
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哲學評鑒(第四輯):概念、命題與知識(簡體書)
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出版日:2025/12/29 作者:《哲學評鑒》編輯委員會 編著  出版社:上海社會科學院出版社  裝訂:平裝
《哲學評鑒》的第一、二、三輯已於2022、2024、2025年由上海社會科學院出版社出版,在學界收穫了積極的評價。第四輯以“概念、命題與知識”為主題,收錄原創論文5篇,綜述2篇,書評2篇,論文批評及回應2篇,以及評審與修訂欄目。原創論文涉及概念工程和概念倫理、荀子道德動機理論、列維納斯主體性思想理論等主題。綜述介紹了康德“先驗演繹”和因果律問題的當代研究。書評涉及規範性和亞裡士多德修辭學的哲學研究。評論圍繞賴長生的論文“Remembering Requires No Reliability”展開,包含國內相關哲學領域學者的評論以及作者的回應。本書展示了相關研究專家及青年學者在中西哲學領域的最新研究成果,提供了獨特的立場和視角,對於普通讀者來說,一些晦澀高深且跨越多領域的哲學思想的發展脈絡和理論基點由此具有相對清晰的可見性;對於專業學者而言,書中的一些梳理、介紹、研究、評判,也具有一定的啟發意義。
優惠價: 87 303
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結構/機構可靠性設計基礎(英文版)(簡體書)
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出版日:2024/01/17 作者:呂震宙  出版社:科學出版社  裝訂:平裝
《Fundamental of Structure and Mechanism Reliability Design(結構/機構可靠性設計基礎)》較為系統地介紹了隨機不確定性下靜態及時變結構可靠性分析與結構優化設計的基本理論和高效算法。主要內容包括:(1)可靠性和可靠性靈敏度分析的矩方法;(2)可靠性和可靠性靈敏度分析的數值模擬法;(3)可靠性和可靠性局部靈敏度分析的代理模型法;(4)時變結構可靠性分析的數值模擬法、極值法、跨越率法、包絡函數法和代理模型法;(5)失效概率函數的高效求解法;(7)可靠性全域靈敏度分析的新方法;(8)可靠性優化設計概念、單層法、雙層法、解耦法和完全解耦法。
優惠價: 87 2349
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